3D Comb-Structure MIM Capacitor for Higher Capacitance Density

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Solution Overview

Problem

Increasing the capacitance of MIM capacitors in semiconductor devices without reducing the areal density of the devices is desired, as larger plate areas typically reduce the density of devices that can be fabricated on a substrate.

Innovation Solution

Fabricating MIM capacitors with a comb structure that increases the effective area without increasing the footprint, achieved by forming trenches and tines in the dielectric layer, and using high-k dielectric materials to enhance capacitance.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Quantity of substance

If the plate area of MIM capacitors is increased to enhance capacitance, then capacitance value is improved, but areal density of devices is reduced

Engineering Contradiction:
Improvecapacitance valueVSAvoidareal density
Core Design Contradiction:
Quantity of substanceVSArea of stationary object

Solution Approach 1:

The patent transitions from a conventional planar parallel-plate capacitor structure to a three-dimensional stacked structure with multiple capacitor units arranged vertically. This dimensional change allows capacitance to be increased without proportionally increasing the horizontal footprint, thereby maintaining areal density while achieving higher total capacitance through vertical stacking of multiple capacitor units sharing common electrodes.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Solution Approach 2:

The capacitor structure is segmented into multiple discrete capacitor units stacked vertically, with shared common electrodes between adjacent units. Each capacitor unit can be independently formed and controlled, allowing the total capacitance to be the sum of individual unit capacitances while occupying the same horizontal area, thus resolving the contradiction between capacitance value and areal density.

Inventive Principle:
Principle #1Segmentation

2Ease of manufacture

If conventional parallel plate structure is used, then manufacturing is simple, but capacitance per unit area is limited

Engineering Contradiction:
Improvestructural simplicityVSAvoidcapacitance per unit area
Core Design Contradiction:
Ease of manufactureVSQuantity of substance

Solution Approach 1:

Multiple capacitor units are nested vertically in a stacked configuration, with lower electrodes of upper capacitor units serving as upper electrodes of lower capacitor units. This nesting arrangement maximizes the use of vertical space and allows multiple capacitance elements to occupy the same horizontal footprint, significantly increasing capacitance per unit area while maintaining compatibility with standard semiconductor manufacturing processes.

Inventive Principle:
Principle #7Nested doll (Nesting)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The comb structure design allows for a 1.1× to 3× increase in capacitance without reducing areal density, making it suitable for applications like CMOS image sensors requiring high capacitance without increasing device size.

Implementation Method 1

using high-k dielectric materials to enhance capacitance

Methodology Applied
Scientific EffectDielectric permittivity: Dielectric Permittivity

Data Source

PatentUS12593682B2Three dimensional MIM capacitor having a comb structure and methods of making the same
Publication Date: 2026.03.31 TAIWAN SEMICONDUCTOR MANUFACTURING CO LTD
  • US12593682B2 patent drawing
  • US12593682B2 patent drawing
  • US12593682B2 patent drawing

AI summary

Metal-insulator-metal (MIM) capacitor, an integrated semiconductor device having a MIM capacitor and methods of making. The MIM capacitor includes a first metal layer, a second metal layer and a dielectric layer located between the second metal layer and the first metal layer. The first metal layer, the second metal layer and the dielectric layer may be formed in a comb structure, wherein the comb structure include a first tine structure and at least a second tine structure.