3D NAND Error Differentiation for Refresh vs In-Place Reprogramming

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Solution Overview

Problem

Flash memory devices face inefficiencies in data updating due to read disturbance and retention errors, leading to resource consumption and garbage collection issues, as existing methods either refresh or reprogram cells without distinguishing between error types.

Innovation Solution

A system and method that selectively updates NAND flash memory cells by detecting error conditions, distinguishing between read disturbance and retention errors, and initiating either a refresh operation to write data to a new page or a reprogramming operation to rewrite data within the same page, thereby conserving resources and reducing time and resource consumption.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If all flash memory cells are refreshed regardless of error type, then data retention is improved, but resource consumption and garbage collection overhead increase

Engineering Contradiction:
Improvedata retentionVSAvoidresource consumption
Core Design Contradiction:
ReliabilityVSLoss of energy

Solution Approach 1:

The patent applies local quality by differentiating between two types of error-prone cells (read-disturbed cells and retention-error cells) and applying different refresh strategies to each type. Read-disturbed cells receive targeted refresh operations while retention-error cells receive reprogramming, avoiding uniform treatment of all cells and reducing unnecessary resource consumption.

Inventive Principle:
Principle #3Local quality

Solution Approach 2:

The patent segments the error correction process into two distinct pathways: one for read-disturbed cells that involves refreshing to a new location, and another for retention-error cells that involves reprogramming in place. This segmentation allows the system to optimize resource usage by applying the appropriate operation to the appropriate cell type.

Inventive Principle:
Principle #1Segmentation

2Reliability

If read-disturbed cells are refreshed to a new location, then data accuracy is improved, but erase operations and garbage collection are increased

Engineering Contradiction:
Improvedata accuracyVSAvoiderase operation efficiency
Core Design Contradiction:
ReliabilityVSProductivity

Solution Approach 1:

The patent segments cells into read-disturbed cells and retention-error cells, applying different operations to each. Read-disturbed cells are refreshed to new locations while retention-error cells are reprogrammed in place, preventing unnecessary erase operations and improving overall productivity.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent applies local quality by identifying specific cells with read disturbance errors and refreshing only those cells to new locations, rather than performing blanket refresh operations on entire blocks. This targeted approach reduces the number of erase operations required.

Inventive Principle:
Principle #3Local quality

3Loss of energy

If retention-error cells are reprogrammed in place, then resource consumption is reduced, but data accuracy may be compromised without proper error differentiation

Engineering Contradiction:
Improveresource consumptionVSAvoiddata accuracy
Core Design Contradiction:
Loss of energyVSReliability

Solution Approach 1:

The patent applies local quality by identifying specific cells with retention errors and reprogramming only those cells in place, while leaving other cells unchanged. This targeted approach ensures data accuracy for affected cells while minimizing resource consumption.

Inventive Principle:
Principle #3Local quality

Solution Approach 2:

The patent segments the error correction process into two distinct pathways: one for read-disturbed cells that involves refreshing to a new location, and another for retention-error cells that involves reprogramming in place. This segmentation ensures that each cell type receives the appropriate operation for maintaining data accuracy.

Inventive Principle:
Principle #1Segmentation

4Productivity

If error differentiation is implemented, then operational efficiency is improved, but system complexity increases

Engineering Contradiction:
Improveoperational efficiencyVSAvoiderror detection and classification system
Core Design Contradiction:
ProductivityVSDevice complexity

Solution Approach 1:

The patent segments the error correction process into two distinct pathways based on error type, with separate handling logic for read-disturbed cells and retention-error cells. This segmentation improves operational efficiency by applying the right operation to the right cell type.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent applies local quality by implementing error differentiation at the cell level, where each cell's error type determines its refresh strategy. This approach balances operational efficiency with manageable complexity by focusing differentiation only where needed.

Inventive Principle:
Principle #3Local quality

Data Source

PatentUS10290353B2Error mitigation for 3D NAND flash memory
Publication Date: 2019.05.14 SANDISK TECHNOLOGIES LLC
  • US10290353B2 patent drawing
  • US10290353B2 patent drawing
  • US10290353B2 patent drawing

AI summary

NAND cell error remediation technologies are disclosed. The remediation technologies are applicable to 3D NAND. In one example, a storage device may include a processor and a memory device comprising NAND flash memory. The processor is configured to detect an error condition associated with a first page of the NAND flash memory, and determine whether the error condition is associated with a read disturbance or with a retention error. The processor is configured to initiate, if the error condition is associated with the read disturbance, a refresh operation with respect to the page to write data stored at the first page to a second page of the NAND flash memory, and initiate, if the error condition is associated with the retention error, a reprogramming operation with respect to the page to rewrite the data stored at the first page to the first page of the NAND flash memory.