3D Object Inspection With Dual-Mode Matrix Imaging

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Solution Overview

Problem

Existing methods for inspecting 3-dimensional objects, particularly pouch cells, are either complex or provide limited quality assessment, making them unsuitable for comprehensive defect detection.

Innovation Solution

A device and method utilizing a motion detection system, line and area illumination, and a matrix camera to capture and process image information, enabling line-by-line and matrix-by-matrix analysis of the object's surface to detect defects and determine quality indices.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If multiple separate inspection units (thickness measuring unit, printing unit, tab inspection unit, weighing unit, tab testing unit) are used to inspect pouch cells, then comprehensive quality assessment is achieved, but device complexity increases significantly

Engineering Contradiction:
Improvequality assessment comprehensivenessVSAvoidinspection system complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The patent combines multiple separate inspection functions (thickness measurement, printing, tab inspection, weighing, tab testing) into a single integrated inspection device. The device uses one camera unit that can perform all these inspection tasks sequentially, eliminating the need for multiple separate units and significantly reducing device complexity while maintaining comprehensive quality assessment capability.

Inventive Principle:
Principle #5Merging (Combining)

Solution Approach 2:

The inspection device is designed as a universal system where a single camera unit can perform multiple inspection functions. The device can measure thickness, inspect printing quality, check tab dimensions and shape, and detect defects, all using the same hardware platform. This multi-functionality approach reduces the number of components needed while achieving comprehensive quality assessment.

Inventive Principle:
Principle #6Universality (Multi-functionality)

2Measurement precision

If complex inspection systems with multiple units are deployed, then comprehensive quality control is achieved, but manufacturing cost increases

Engineering Contradiction:
Improvequality control comprehensivenessVSAvoidmanufacturing cost
Core Design Contradiction:
Measurement precisionVSEase of manufacture

Solution Approach 1:

By merging multiple inspection functions into a single device, the patent reduces the total manufacturing cost. Instead of producing and installing multiple separate inspection units, the invention creates one integrated system that performs all necessary quality control functions, thereby reducing component costs, assembly complexity, and overall manufacturing expenditure.

Inventive Principle:
Principle #5Merging (Combining)

Solution Approach 2:

The universal inspection device can perform thickness measurement, printing inspection, tab inspection, and defect detection using the same hardware platform. This multi-functionality eliminates the need to manufacture and maintain multiple separate systems, significantly reducing the manufacturing cost while maintaining comprehensive quality control capabilities.

Inventive Principle:
Principle #6Universality (Multi-functionality)

3Measurement precision

If optical coherence tomography is used to inspect gaps between lead foil and terminal tab, then closure quality is detected, but the inspection significance for overall pouch cell quality is limited

Engineering Contradiction:
Improveclosure quality detectionVSAvoidquality assessment relevance
Core Design Contradiction:
Measurement precisionVSAdaptability or versatility

Solution Approach 1:

The inspection device is designed to perform multiple inspection functions including closure quality detection, thickness measurement, printing inspection, tab inspection, and defect detection. By making the system universal, it can assess various quality aspects of the pouch cell, ensuring that the inspection results are relevant and comprehensive rather than limited to a single parameter like closure gaps.

Inventive Principle:
Principle #6Universality (Multi-functionality)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Enables rapid and comprehensive quality assessment of 3-dimensional objects by detecting various defects, including topological and absorbing defects, with a single matrix camera, reducing complexity and cost.

Implementation Method 1

the line illumination device for illuminating a linear region of the upper side of the object to be inspected

Methodology Applied
Scientific EffectLight reflection: Reflection

Implementation Method 2

the area illumination device for illuminating the upper side of the housing of the object to be inspected from above

Methodology Applied
Scientific EffectLight reflection: Reflection

Data Source

PatentEP4636392A1Device for inspecting three-dimensional objects
Publication Date: 2025.10.22 ISRA VISION GMBH
  • EP4636392A1 patent drawingFigure 1
  • EP4636392A1 patent drawingFigure 2
  • EP4636392A1 patent drawingFigure 3

AI summary

The invention relates to a device (1, 101) for inspecting 3-dimensional objects, for example pouch cells (11, 31, 111), and a corresponding method, wherein each object has a housing with a top side and a bottom side, wherein the top side of the housing (12, 112) is composed of at least one upper surface section (13, 113) and a plurality of lateral surface sections (17, 18, 21, 22, 23, 24, 117, 118, 121, 122, 123, 124, 125, 126, 127, 128, 129), wherein the device comprises • a movement detection device, • a line illumination device (51) for illuminating a line-shaped region of the top side of the object to be inspected, • an area illumination device (52, 53, 55, 56) for illuminating the top of the housing of the object to be inspected from above in its resting state,• a matrix camera (40) arranged above the rest position of the object to be inspected in each case for capturing image information in a field of view, wherein the field of view is configured o for line-by-line capturing of the light of the line illumination device reflected from the linear region of the upper side in the moving state of the object to be inspected and o for matrix-by-matrix capturing of the light of the area illumination device reflected upwards from the entire upper side in the rest state of the object to be inspected, and wherein a data processing device (70, 170) is provided which determines the presence of a defect of at least one defect type from the captured image information and/or determines a quality index which allows an assessment of the quality of the object.