3D Printer Calibration via Interference Patterns
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Solution Overview
Problem
Existing calibration methods for devices producing three-dimensional objects by layer-by-layer solidification of building materials have limited accuracy, which can lead to inaccuracies in positioning and orientation, affecting the precision of delicate structures and overall dimensional accuracy.
Innovation Solution
A method involving the generation of substantially periodic modulation patterns in overlapping areas of a construction field, with detection and adjustment of the overlay pattern's position relative to a reference, using electromagnetic radiation or particle beams, to achieve precise calibration and correction of deviations.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Area of stationary object
If multiple laser beams are used with overlapping sub-areas, then the construction field coverage is improved, but the positioning accuracy deteriorates due to alignment deviations between beams
Solution Approach 1:
The patent replaces mechanical alignment methods with optical interference patterns. By using electromagnetic radiation to create interference patterns in the overlap zones, the system achieves sub-micrometer positioning accuracy without relying on mechanical alignment of multiple laser beams, thus resolving the contradiction between coverage and precision
Solution Approach 2:
The patent introduces interference patterns as an intermediary measurement mechanism. These patterns serve as a mediator that translates the relative positions of multiple laser beams into measurable optical signals, enabling precise calibration of beam alignments and eliminating direct mechanical positioning errors
2Loss of time
If calibration is performed before actual construction, then the setup time is reduced, but the calibration accuracy is limited by the simplicity of test patterns
Solution Approach 1:
The patent changes the parameter of the calibration pattern from simple geometric shapes to complex interference patterns with varying spatial frequencies. This transformation enables much higher measurement precision while maintaining the same calibration timing, as the interference patterns provide richer positional information for accurate beam alignment measurement
3Ease of operation
If simple test patterns are used for calibration, then the detection process is simplified, but the measurement resolution is insufficient for delicate structures
Solution Approach 1:
The patent employs periodic interference patterns with specific spatial frequencies to create measurable variations in the overlap zones. These periodic patterns provide high-contrast, easily detectable signals that maintain detection simplicity while achieving sub-micrometer measurement resolution, thus resolving the contradiction between ease of detection and measurement precision
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach enables high-dimensional accuracy and the production of delicate three-dimensional objects by correcting positional deviations, ensuring precise solidification and maintaining accuracy throughout the manufacturing process.
Implementation Method 1
a solidification device for radiating beams of electromagnetic radiation or particle beams onto selective locations of the construction field
Implementation Method 2
producing a three-dimensional object by selectively solidifying building material layer by layer
Implementation Method 3
The first modulation pattern and the second modulation pattern form a substantially periodic overlay pattern in the overlap zone
Data Source
Figure 1
Figure 2
Figure 3A~3B
AI summary
Method for calibrating a device (1) for producing a three-dimensional object (2) by layer-by-layer selective solidification of build material (15) comprising the step of generating a substantially periodic first modulation pattern (101) in a first sub-area (100) of a build area (8), the step of generating a substantially periodic second modulation pattern (201) in a second sub-area (200) of the build area (8), wherein the first modulation pattern (101) and the second modulation pattern (201) form a substantially periodic superposition pattern (301) in the overlap zone (300), the period of which is greater than the period of the first modulation pattern (101) and the period of the second modulation pattern (201), the step of detecting the superposition pattern (301), and the step of determining the deviation of the position of the superposition pattern (301) on the build area (8) from a reference position.