3D Scanning Aperture Geometry for Depth-of-Field Control

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Solution Overview

Problem

Conventional optical scanning systems face issues with low image capturing quality due to insufficient light reception, particularly in non-elliptical pinholes, and insufficient image intensity in elliptical pinholes, affecting the scanning depth of field and pattern intensity in low illumination environments.

Innovation Solution

A three-dimensional scanning apparatus with aperture elements designed to enhance light reception and maintain scanning depth of field, featuring lateral sides with specific length ratios and angles to increase the intensity of the detection pattern, utilizing quadrilateral or polygonal apertures with structured lateral and longitudinal dimensions to optimize light penetration.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Device complexity

If a non-elliptical pinhole aperture is used, then the device complexity is reduced, but the image capturing quality deteriorates due to low light reception

Engineering Contradiction:
Improveaperture structureVSAvoidimage capturing quality
Core Design Contradiction:
Device complexityVSMeasurement precision

Solution Approach 1:

The patent applies asymmetry by designing the aperture element with different side lengths (first lateral side length different from second lateral side length) to optimize the balance between light reception area and depth of field control, resolving the contradiction between simple structure and image quality

Inventive Principle:
Principle #4Asymmetry

2Illumination intensity

If an elliptical pinhole aperture is used, then the amount of light received increases, but the image intensity remains insufficient

Engineering Contradiction:
Improvelight receivedVSAvoidimage intensity
Core Design Contradiction:
Illumination intensityVSMeasurement precision

Solution Approach 1:

The patent changes the geometric parameters of the aperture by specifying particular side length ratios (between 1:1 and 1:5) and angular relationships, optimizing both light transmission and image intensity simultaneously through precise parameter control

Inventive Principle:
Principle #35Parameter changes

3Illumination intensity

If the aperture size is increased to increase light reception, then the scanning depth of field decreases

Engineering Contradiction:
Improvelight receptionVSAvoidscanning depth of field
Core Design Contradiction:
Illumination intensityVSLength of stationary object

Solution Approach 1:

The asymmetric aperture design with specifically proportioned sides allows the aperture to admit sufficient light while maintaining the optical constraints necessary for adequate depth of field, resolving the trade-off between light reception and scanning depth

Inventive Principle:
Principle #4Asymmetry

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The apparatus stabilizes the scanning depth of field and increases pattern intensity, enabling accurate and clear contour detection by adjusting aperture element shapes and ratios, enhancing detection accuracy in low illumination conditions.

Implementation Method 1

an illumination light source adapted to emit an illumination beam; a reference pattern generator adapted to provide a reference pattern by the illumination beam

Methodology Applied
Scientific EffectLight: Light

Implementation Method 2

The optical receiver is adapted to receive a detection pattern reflected from the object

Methodology Applied
Scientific EffectReflection: Reflection

Data Source

PatentUS20250277661A1Three dimensional scanning apparatus
Publication Date: 2025.09.04 QISDA CORP
  • US20250277661A1 patent drawing
  • US20250277661A1 patent drawing
  • US20250277661A1 patent drawing

AI summary

A three dimensional scanning apparatus is used to detect a contour of an object, and includes an illumination light source, a first aperture element, a reference pattern generator and an optical receiver. The illumination light source emits an illumination beam. The reference pattern generator provides a reference pattern by projection of the illumination beam, and transmits the reference pattern toward the object via the first aperture element. The optical receiver receives a detection pattern reflected from the object, so as to analyze difference between the reference pattern and the detection pattern for acquiring the contour. The first aperture element has two first lateral sides and two second lateral sides opposite to each other. A first length of one of the first lateral sides is greater than a second length of one of the second lateral sides.