3D Shape Measurement Using Segmented Line Patterns
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Solution Overview
Problem
Conventional methods for measuring the three-dimensional shape of an object using projected illumination patterns are time-consuming due to the extensive search process required to match image and pattern correspondence.
Innovation Solution
An information processing apparatus that projects a pattern with lines and identification information, allowing for the rapid acquisition and correlation of shape information by setting candidates for shape information in specific areas and evaluating their correspondence with the pattern, thereby reducing the calculation burden and increasing measurement speed.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If a conventional illumination pattern with dots is used for three-dimensional shape measurement, then the measurement can be performed, but the search process for correspondence between image and pattern takes too much time
Solution Approach 1:
The illumination pattern is segmented into multiple lines with identification information, allowing the correspondence search to be divided into line-by-line matching operations. This segmentation reduces the overall search space and computational complexity compared to searching for dot correspondences across the entire pattern.
Solution Approach 2:
Identification information is preliminarily assigned to each line in the illumination pattern before projection. This preliminary action enables the imaging apparatus to quickly identify and associate specific lines with their corresponding pattern elements, eliminating the need for exhaustive search operations and significantly reducing correspondence determination time.
2Area of stationary object
If the search area is increased to improve measurement coverage, then more of the object can be measured, but the search process takes longer
Solution Approach 1:
The measurement area is divided into multiple line segments, each with its own identification information. This allows the system to process and match correspondences for each line independently and in parallel, maintaining fast processing speeds even when measuring large-area objects that would require extensive search coverage.
Data Source
AI summary
To measure a three-dimensional shape of a measurement target object at high speeds, an information processing apparatus is configured to acquire an image captured while a pattern including first features and a second feature is projected onto the measurement target object; identify the first features in the captured image, and acquire an initial value of shape information on the measurement target object in an area including the first features; set a candidate for the shape information in a first area based on an initial value of shape information in an area surrounding the first area; decide an area in the pattern corresponding to the first area as a second area, and evaluate a correlation between the second area and the first area based on the second feature in the first area and the second feature in the second area; and derive the shape information in the first area.