3D Shape Measuring Apparatus Rotation Unit Blind Spot Reduction
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Solution Overview
Problem
Conventional three-dimensional shape measuring apparatuses are limited in measuring shapes over a wide range due to blind spots created by the positioning of light projecting and receiving components, which cannot irradiate or capture images of portions facing downward or at specific angles.
Innovation Solution
A three-dimensional shape measuring apparatus with a stage, a projector, and a camera system that includes a rotation unit, allowing for the measurement subject to be placed on the stage or rotated to enable pattern light to be incident on desired portions, and a processor that controls the system to generate three-dimensional shape data from multiple images captured at different positions and angles.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Device complexity
If the measurement subject is placed on the stage below the light projecting portion and light receiving portion, then the measurement can be performed with a simple configuration, but a portion of the measurement subject facing downward becomes a blind spot and cannot be measured
Solution Approach 1:
The patent introduces a rotation unit that can rotate the measurement subject about a rotation axis intersecting the optical axis of the camera. This dynamic rotation capability allows the measurement subject to be repositioned during measurement, enabling the light to illuminate previously hidden surfaces and the camera to capture images of areas that were initially in blind spots, thereby expanding the measurable range without complicating the overall device configuration.
2Adaptability or versatility
If the stage is configured to move the placement surface in X and Y directions and rotate about an orthogonal axis, then the user can measure desired portions by moving or rotating, but specific portions cannot be removed from the blind spot even with movement or rotation
Solution Approach 1:
The patent adds a rotation dimension by introducing a rotation unit that rotates the measurement subject about a rotation axis intersecting the optical axis of the camera. This creates a new rotational degree of freedom that works in conjunction with the existing X-Y translation and vertical rotation capabilities of the stage, forming a multi-dimensional measurement system that eliminates blind spots through comprehensive angular coverage.
3Device complexity
If pattern light is emitted from a fixed position obliquely above, then the system structure is simple, but the measurable area is limited by the blind spot region
Solution Approach 1:
The rotation unit dynamically repositions the measurement subject during measurement, allowing the fixed pattern light source to illuminate different surfaces as the measurement subject rotates. This dynamic adjustment of the measurement subject's orientation enables comprehensive surface coverage while maintaining the simplicity of the fixed light source configuration.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables measurement of shapes over a wider range by overcoming blind spots and expanding the measurable area beyond the initial imaging region, providing more comprehensive and accurate three-dimensional data.
Implementation Method 1
receives, through a telecentric optical system, pattern light reflected from the measurement subject when the measurement subject is irradiated with the pattern light a plurality of times from the projector
Data Source
AI summary
A shape measuring apparatus includes a stage, a light projecting portion, a light receiving portion, and a rotation unit. The rotation unit is attached to an end of the stage. The rotation unit rotates the measurement subject about a rotation axis that vertically intersects while holding the measurement subject. In a state where the measurement subject is at a predetermined rotation angular position, the pattern light is emitted from the light projecting portion to the measurement subject a plurality of times while being phase-shifted. At this time, the light receiving portion captures an image of the measurement subject. Three-dimensional shape data is generated on the basis of a plurality of pieces of image data obtained by imaging.


