3D Shape Measurement and Path Correction for Beam Processing
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Solution Overview
Problem
Existing processing methods struggle to accurately process objects due to inaccuracies in positioning and shape measurement of holding tools, leading to inefficiencies and potential errors in processing operations.
Innovation Solution
A method that involves acquiring holding tool information and measurement information using a measurement apparatus, generating processing path information, and processing the object based on this data to ensure precise positioning and irradiation, including the use of non-processing beams for detection and correction of errors.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Manufacturing precision
If a processing apparatus irradiates a processing target object with a processing beam, then the object can be processed, but positioning accuracy and shape measurement accuracy of the holding tool deteriorate
Solution Approach 1:
The patent measures the three-dimensional shape and position of the holding tool and processing target object BEFORE processing with the processing beam. By acquiring measurement information in advance and generating processing path information beforehand, the system ensures accurate positioning without the measurement being affected by the processing beam irradiation.
Solution Approach 2:
The patent introduces a measurement apparatus as an intermediary device that separately measures the holding tool and processing target object. This measurement apparatus acts as a mediator between the processing apparatus and the objects, allowing accurate measurement without direct interference from the processing beam.
2Manufacturing precision
If measurement information is acquired during processing, then real-time correction is possible, but processing time increases
Solution Approach 1:
The patent performs all necessary measurements and generates processing path information BEFORE the actual processing begins. The measurement apparatus measures the holding tool and processing target object in advance, and the control apparatus generates complete processing path information beforehand, eliminating the need for time-consuming measurements during processing.
Solution Approach 2:
The patent divides the overall process into distinct sequential stages: measurement stage (acquiring three-dimensional shape and position information), information processing stage (generating processing path information), and execution stage (processing with processing beam). This segmentation allows each stage to be optimized independently, with measurements completed before processing to avoid time loss.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enhances the accuracy and efficiency of processing operations by ensuring precise positioning and correction of errors, improving the quality and consistency of processed objects.
Implementation Method 1
acquiring, by using the measurement apparatus, measurement information that includes information related to a three-dimensional shape of the processing target object
Implementation Method 2
processing apparatus configured to process the processing target object by irradiating the processing target object held by a holding tool with a processing beam
Implementation Method 3
irradiating the processing target object with a non-processing beam, which is different from the processing beam, based on the generated processing path information; detecting an irradiation state of the non-processing beam to the processing target object
Data Source
AI summary
A processing method is a processing method for processing a processing target object held by a holding tool, and acquires holding tool information related to a position of a reference part of the holding tool placed in the processing apparatus, in a processing coordinate system; sets the holding tool in a measurement apparatus; acquires, by using the measurement apparatus, measurement information including information related to a three-dimensional shape of the processing target object in a measurement coordinate system and information related to a position of the reference part in the measurement coordinate system; generates processing path information based on the measurement information and the holding tool information; places the holding tool, which has been taken out of the measurement apparatus, in the processing apparatus; and processes the processing target object on the holding tool placed in the processing apparatus based on the processing path information.


