3D Test Chart for Multi-Depth Camera Resolution Analysis

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Solution Overview

Problem

Existing camera performance testing methods using two-dimensional test charts are limited in measuring camera performance at various depths due to the depth of field (DOF) constraints of camera lenses, leading to inaccurate or failed tests.

Innovation Solution

A camera test device utilizing a three-dimensional (3D) test chart capable of measuring camera performance at various depths by receiving image data from a camera module and analyzing resolution by depth, thereby reducing the impact of DOF on test accuracy.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Device complexity

If a 2D test chart is used for camera performance testing, then the test setup is simple, but the measurement is limited to a single depth and angle

Engineering Contradiction:
Improvetest setup complexityVSAvoidmeasurement depth range
Core Design Contradiction:
Device complexityVSAdaptability or versatility

Solution Approach 1:

The patent transitions from a two-dimensional test chart to a three-dimensional test chart with patterns arranged at multiple depths along the optical axis. This dimensional change enables the camera to capture test patterns at various focal distances simultaneously, resolving the contradiction between simple setup and multi-depth measurement capability

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

2Device complexity

If a 2D test chart is used, then the test chart structure is simple, but the test fails when focus adjustment error occurs due to depth of field constraints

Engineering Contradiction:
Improvetest chart structureVSAvoidtest stability
Core Design Contradiction:
Device complexityVSReliability

Solution Approach 1:

By arranging test patterns at multiple depths in three-dimensional space rather than on a single plane, the system ensures that at least some patterns remain within the acceptable depth of field range even when focus adjustment errors occur, thereby maintaining test reliability without significantly increasing structural complexity

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Solution Approach 2:

Different regions of the test chart at different depths serve specific testing purposes, with patterns positioned to test various focal lengths and depth of field conditions independently, allowing the system to maintain reliability across varying focus conditions

Inventive Principle:
Principle #3Local quality

3Productivity

If camera performance is measured at a fixed depth, then the measurement process is simple, but the camera performance at various depths cannot be evaluated

Engineering Contradiction:
Improvemeasurement efficiencyVSAvoiddepth evaluation capability
Core Design Contradiction:
ProductivityVSAdaptability or versatility

Solution Approach 1:

The three-dimensional test chart allows the camera to capture multiple depth planes in a single shot, enabling simultaneous evaluation of performance across various depths without requiring multiple separate measurements, thus maintaining efficiency while gaining depth versatility

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Solution Approach 2:

The test chart structure enables a single measurement session to serve multiple testing functions across different focal lengths and depths, making the measurement process both efficient and adaptable to various evaluation requirements

Inventive Principle:
Principle #6Universality (Multi-functionality)

Data Source

PatentUS20250142047A1Camera test devices
Publication Date: 2025.05.01 SAMSUNG ELECTRONICS CO LTD
  • US20250142047A1 patent drawing
  • US20250142047A1 patent drawing
  • US20250142047A1 patent drawing

AI summary

An operating method of a camera test device using a test chart includes an operation of receiving, from a camera module, image data generated by imaging the test chart and an operation of measuring a resolution by depth of the camera module from the image data, wherein the test chart is a three-dimensional (3D) chart including a first test pattern radiating from a vertex of the test chart, and the first test pattern is a pattern of an outer surface of the test chart in which white and black surfaces are arranged alternately.