4Pi Imaging With Vortex Phase Plates for Simplified 3D Localization

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Solution Overview

Problem

Current interferometric single-molecule localization microscopy (iSMLM) techniques require complex optical instrumentation and multiple detection channels, limiting their adoption and accessibility in biological research due to high calibration and operational requirements.

Innovation Solution

An imaging system utilizing a single beamsplitter, vortex phase plates, and a 4Pi detection configuration to encode z-position information in azimuthal phases, simplifying the optical layout and reducing the number of detection channels to two.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If multiple detection channels are used to maximize full imaging depth in interferometry, then measurement precision is improved, but device complexity increases

Engineering Contradiction:
Improveaxial resolutionVSAvoidoptical configuration complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The patent merges multiple detection channels into a single detection channel by combining the optical paths from multiple objective lenses through beam combining optics. This allows the system to maintain multi-channel detection capabilities while using only one detector, thereby reducing device complexity while preserving measurement precision in the axial direction.

Inventive Principle:
Principle #5Merging (Combining)

Solution Approach 2:

The single detection channel is designed to handle multiple optical paths simultaneously, making it multi-functional. The detection channel serves both to collect interference patterns from different objective lenses and to provide full imaging depth information, replacing the need for multiple specialized detection channels.

Inventive Principle:
Principle #6Universality (Multi-functionality)

2Measurement precision

If multiple precisely-aligned beamsplitters or custom-engineered optical components are used, then measurement precision is improved, but ease of manufacture deteriorates

Engineering Contradiction:
Improvez-localization precisionVSAvoidsystem assembly difficulty
Core Design Contradiction:
Measurement precisionVSEase of manufacture

Solution Approach 1:

The patent extracts the complex alignment requirements from the optical system by using a simplified beam combining configuration that does not require multiple precisely-aligned beamsplitters. The design removes the need for custom-engineered optical components while maintaining the ability to achieve high z-localization precision through standard optical elements.

Inventive Principle:
Principle #2Taking out (Extraction)

Solution Approach 2:

The system replaces expensive, custom-engineered optical components with standard, commercially available optical elements. This substitution makes the system easier to manufacture and assemble while maintaining measurement precision, aligning with the principle of using simpler, more accessible components.

Inventive Principle:
Principle #27Cheap short-living objects (Disposable)

3Measurement precision

If complex optical instrumentation is used, then measurement precision is improved, but ease of operation deteriorates

Engineering Contradiction:
Improve3D spatial resolutionVSAvoidcalibration complexity
Core Design Contradiction:
Measurement precisionVSEase of operation

Solution Approach 1:

The patent combines multiple optical paths into a single detection channel, which simplifies the operational complexity. The merged configuration reduces the number of calibration steps required while maintaining ultra-high 3D spatial resolution, making the system easier to operate without sacrificing measurement precision.

Inventive Principle:
Principle #5Merging (Combining)

4Ease of operation

If conventional SMLM techniques are used, then ease of operation is improved, but measurement precision deteriorates

Engineering Contradiction:
Improvesystem accessibilityVSAvoidaxial resolution
Core Design Contradiction:
Ease of operationVSMeasurement precision

Solution Approach 1:

The patent replaces the complex mechanical and optical configuration of conventional interferometric systems with a simplified beam combining approach. This substitution maintains the ultra-high axial resolution capability while significantly improving ease of operation and system accessibility, bridging the gap between simple SMLM and complex interferometric methods.

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Achieves ultra-high 3D resolution with simplified system construction and operation, comparable to conventional iSMLM methods, making it more accessible and suitable for commercialization.

Implementation Method 1

emission from the first objective lens and the second objective lens

Methodology Applied
Scientific EffectFluorescence emission: Fluorescence

Implementation Method 2

a beamsplitter, a first optical arm, a second optical arm and one or more detectors arranged to receive an image from the beamsplitter

Methodology Applied
Scientific EffectBeam splitting:

Implementation Method 3

The first optical arm includes a first objective lens, a first phase plate and a first mirror. The first mirror is arranged to direct emission from the first objective lens through the first phase plate towards the beamsplitter

Methodology Applied
Scientific EffectPhase modulation: Phase Modulation

Data Source

PatentUS20250231392A1Imaging system
Publication Date: 2025.07.17 NATIONAL UNIVERSITY OF SINGAPORE
  • US20250231392A1 patent drawing
  • US20250231392A1 patent drawing
  • US20250231392A1 patent drawing

AI summary

An imaging system is provided. The imaging system includes a beamsplitter, a first optical arm, a second optical arm and or more detectors arranged to receive an image from the beamsplitter. The first optical arm includes a first objective lens, a first phase plate and a first mirror. The first mirror is arranged to direct emission from the first objective lens through the first phase plate towards the beamsplitter. The second optical arm includes a second objective lens, a second phase plate and a second mirror. The second mirror is arranged to direct emission from the second objective lens through the second phase plate towards the beamsplitter. The first and second objective lenses and are in an opposing relationship.