Abnormality Cause Estimation Using Pre-Divided Event Models

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Solution Overview

Problem

Existing diagnostic techniques for large-sized equipment, such as compressors, face challenges in constructing diagnostic models that account for varying device configurations, connection forms, and measurement parameters across different plants, leading to inefficiencies and inaccuracies in abnormality cause estimation.

Innovation Solution

The proposed solution involves an abnormality cause estimation device that inputs measurement values from sensors into an abnormality determination unit, which then uses pre-divided abnormality event models to estimate the cause of abnormalities in equipment. This approach allows for accurate and efficient estimation of abnormality causes by considering the specific configurations and parameters of the equipment.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If a diagnostic model is constructed for each specific equipment configuration and plant, then the accuracy of abnormality cause estimation is improved, but the device complexity and time required for model construction increase

Engineering Contradiction:
Improveaccuracy of abnormality cause estimationVSAvoidcomplexity of diagnostic model construction
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The patent segments the diagnostic model into multiple abnormality event models, each corresponding to a specific type of abnormality event. This segmentation allows the system to handle different equipment configurations and abnormality types separately, improving estimation accuracy while avoiding the need to construct a completely new model for each scenario.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent creates a universal abnormality cause estimation device that can handle multiple equipment types and configurations through a single system. The device uses a database of pre-prepared abnormality event models that can be selected and applied based on the specific equipment being diagnosed, eliminating the need to construct separate diagnostic models for each plant or equipment configuration.

Inventive Principle:
Principle #6Universality (Multi-functionality)

2Measurement precision

If machine learning methods are used to correlate measurement parameters with abnormality causes, then the accuracy of cause estimation is improved, but the quantity of data required increases, which is problematic when failure frequency is low

Engineering Contradiction:
Improveaccuracy of cause estimationVSAvoidquantity of abnormality data required
Core Design Contradiction:
Measurement precisionVSQuantity of substance

Solution Approach 1:

The patent performs preliminary action by preparing multiple abnormality event models in advance, each corresponding to different types of abnormality events. These models are created before actual diagnosis occurs, allowing the system to handle low-frequency failures effectively. When an abnormality occurs, the system simply selects the appropriate pre-prepared model rather than requiring extensive data collection and model training at the time of failure.

Inventive Principle:
Principle #10Preliminary action

3Reliability

If the diagnostic model is customized for each equipment configuration and connection form, then the reliability of diagnosis is improved, but the time required for model construction and maintenance increases

Engineering Contradiction:
Improvereliability of diagnosisVSAvoidtime for model construction and maintenance
Core Design Contradiction:
ReliabilityVSLoss of time

Solution Approach 1:

The patent implements a universal diagnostic system that maintains high reliability across different equipment configurations by using a database of pre-prepared abnormality event models. The system can select and apply the appropriate model based on the specific equipment type and configuration, eliminating the need to construct and maintain separate models for each plant while preserving diagnostic reliability.

Inventive Principle:
Principle #6Universality (Multi-functionality)

Solution Approach 2:

The patent uses pre-prepared abnormality event models that can be copied and applied to different equipment instances. Instead of constructing unique models for each equipment configuration, the system maintains template models that can be selected and adapted based on the specific equipment being diagnosed, significantly reducing model construction and maintenance time.

Inventive Principle:
Principle #26Copying

Data Source

PatentEP4542322A1Abnormality cause estimation device, abnormality cause estimation method, and abnormality cause estimation program
Publication Date: 2025.04.23 HITACHI IND PROD LTD
  • EP4542322A1 patent drawingFigure 1
  • EP4542322A1 patent drawingFigure 2
  • EP4542322A1 patent drawingFigure 3

AI summary

The present invention estimates the cause of abnormality of equipment easily and with high accuracy. An abnormality cause estimation device (1) has: a measurement value input unit (2) that receives measurement values obtained from sensors installed in equipment; an abnormality determination unit (4) that determines whether or not there is an abnormality in the measurement values; an abnormality cause estimation unit (6) that estimates the cause of abnormality in the equipment by inputting the presence or absence of abnormality in the measurement values into a selected one of abnormality event models having undergone division in advance on the basis of abnormal events assumed to occur in the equipment; and a result output unit (9) that outputs the estimation result of the cause of the abnormality.