Abnormality Detection Circuit Reducing Substrate Area
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Solution Overview
Problem
Existing abnormality detection devices for semiconductor devices require multiple output terminals for each detection circuit, leading to an excessive increase in the area of the semiconductor substrate used for outputting detection signals.
Innovation Solution
The abnormality detection device incorporates a plurality of detection circuits, registers, selection circuits, an OR circuit, and a single output terminal, with optional bypass and exclusive-OR circuits, to reduce the number of output terminals by selectively routing detection signals through a bypass circuit and an OR or exclusive-OR circuit, thereby minimizing the substrate area.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Ease of operation
If multiple output terminals are provided for each detection circuit, then each abnormality detection signal can be output independently, but the number of output terminals becomes excessively large and the substrate area becomes excessively large
Solution Approach 1:
Multiple detection signals from different detection circuits are merged into a single output terminal through an OR circuit. The OR circuit combines the output signals from multiple detection circuits and registers, allowing all abnormality detection signals to be output through one terminal instead of multiple separate terminals, thereby reducing the substrate area while maintaining the ability to output detection signals for various abnormal states
Solution Approach 2:
The single output terminal is designed to serve multiple functions by receiving and outputting abnormality detection signals from different detection circuits through the OR circuit. This universal output terminal can handle signals from various abnormal states (power supply abnormalities, clock signal abnormalities, etc.) without requiring separate dedicated terminals for each detection circuit
2Ease of operation
If multiple output terminals are provided for each detection circuit, then detection signals can be output for each abnormal state, but the device complexity increases
Solution Approach 1:
The OR circuit merges multiple detection signals into a single output terminal, reducing the number of output terminals from multiple to one. This consolidation maintains the functionality of outputting detection signals for each abnormal state while significantly reducing device complexity and the number of components required
Data Source
AI summary
A first detection circuit and a second detection circuit are provided that output first signals when detecting corresponding abnormal states. A first register and a second register store data corresponding to the first signals input from the corresponding detection circuits and output second signals. The first selection circuit and the second selection circuit determine whether to output third signals based on the second signals input from the corresponding registers among the first register and the second register. An OR circuit outputs a fourth signal based on the third signals input from the first selection circuit and the second selection circuit. One output terminal outputs the fourth signal, which is output from the OR circuit, as an abnormality detection signal.