Absolute Phase Measurement Testing Device for RF Systems
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Solution Overview
Problem
Current testing equipment for RF devices is large, slow, expensive, and lacks accuracy due to noise interference, and lacks the capability to perform high-volume phase measurements, especially for millimeter wave devices which require precise phase adjustment and calibration.
Innovation Solution
A testing device and method that uses up-conversion and down-conversion of signals with a bypass path to measure absolute phase without bi-directional couplers, employing an intermediate frequency source, mixers, and a digitizer to perform Fast Fourier Transform, allowing for accurate phase measurement without the need for complex S-parameters conversion.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If conventional testing equipment is used for RF devices, then phase measurement capability is provided, but the equipment becomes large, slow, expensive, and inaccurate due to noise interference
Solution Approach 1:
The patent extracts the essential phase measurement function from complex conventional test equipment by using a simplified setup with signal sources, mixers, and a bypass path. This extraction eliminates unnecessary components that contribute to size, cost, and noise while preserving the core measurement capability through direct phase comparison between DUT and bypass paths.
Solution Approach 2:
The patent introduces a bypass path as an intermediary reference that carries the same signal through the same test fixtures without passing through the device under test. This intermediary path provides a clean reference signal for phase comparison, enabling accurate absolute phase measurement without requiring complex bi-directional couplers or sophisticated test setups.
2Productivity
If conventional testing equipment is used for RF devices, then phase measurement is possible, but testing speed is slow and volume production testing is not supported
Solution Approach 1:
The patent segments the measurement process into distinct signal paths: a test path through the DUT and a bypass reference path. This segmentation allows parallel processing and rapid sequential measurement of multiple devices, enabling high-volume production testing while maintaining measurement precision through the reference path comparison method.
3Measurement precision
If bench equipment is used for phase measurement, then measurement capability is provided, but the equipment is not adequate for high volume testing due to size, cost, and slow speed
Solution Approach 1:
The patent merges the reference signal generation and device under test signaling into a single signal source that is split and distributed to both paths. This merging eliminates the need for separate bench equipment for reference and measurement, enabling compact, cost-effective test fixtures that support high-volume production testing while maintaining accurate phase measurement capability.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables fast, accurate, and cost-effective measurement of absolute phase shifts in RF devices, suitable for high-frequency applications like 5G and mmWave systems, allowing for real-time antenna element calibration and phase shifter corrections, reducing the need for expensive and cumbersome test setups.
Implementation Method 1
a first mixer at an input of a device under test and which up-converts a signal from the IF frequency source
Implementation Method 2
a second mixer at an output of the device under test and which down-converts a signal received from the device under test or the up-converted signal
Data Source
AI summary
The present disclosure relates to a testing device and techniques of testing semiconductor structures and, more particularly, to an absolute phase measurement testing device and technique of testing semiconductor structures. The structure includes: a first frequency input source which provides a first signal to an up-converter at an input side of a test fixture; a down-converter on an output side of the test fixture; a second frequency signal source which provides a second signal at a higher frequency than the first signal to the up-converter and the down-converter on the output side of the test fixture; a bypass path which bypasses the test fixture and provides connection between the up-converter and the down-converter; and a digitizer that is connected to an output side of the down-converter.