Absorbent Article Processing Position Inspection Using Reference Signal Waveforms

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Solution Overview

Problem

The high cost of infrared cameras and the need for them to be positioned directly after processing sections to account for thermal distribution makes them unsuitable for cost-sensitive production lines, increasing production costs in absorbent article manufacturing.

Innovation Solution

An apparatus and method using a sensor section, reference signal outputting section, and determining section to inspect the actual processing position of semi-finished absorbent articles, with a reference signal having a waveform indicating the allowable range, allowing for pass/fail determination without expensive equipment like infrared cameras.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If infrared cameras are used for inspection, then inspection accuracy is improved, but production cost increases

Engineering Contradiction:
Improveinspection accuracyVSAvoidproduction cost
Core Design Contradiction:
Measurement precisionVSEase of manufacture

Solution Approach 1:

The patent uses a camera to capture images of the semi-finished product and processes these images to extract contour information and determine processing positions. This optical copying and processing approach replaces the need for expensive infrared cameras while maintaining inspection accuracy through image analysis algorithms.

Inventive Principle:
Principle #26Copying

Solution Approach 2:

The patent replaces the thermal detection mechanism of infrared cameras with an optical imaging system combined with digital image processing. By using standard cameras and processing images through binarization and contour detection algorithms, the system achieves the same inspection function without the high cost of infrared technology.

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

2Measurement precision

If infrared cameras are positioned directly after processing sections, then temperature-based inspection accuracy is improved, but device complexity and cost increase

Engineering Contradiction:
Improvetemperature-based inspection accuracyVSAvoidcamera positioning requirements
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The patent captures optical images of the semi-finished product at various stages and processes these images to determine processing positions. By using standard visual imaging rather than thermal imaging, the system eliminates the need for immediate positioning after processing sections while maintaining accurate inspection through image analysis.

Inventive Principle:
Principle #26Copying

Solution Approach 2:

The patent transitions from thermal dimension detection (infrared) to optical dimension detection (visible light imaging). By capturing images and processing them to extract spatial information about processing positions, the system achieves inspection accuracy without the complex positioning requirements of infrared cameras.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Data Source

PatentEP2404583B1Device and method for manufacturing absorptive articles
Publication Date: 2018.06.27 UNI CHARM CORP
  • EP2404583B1 patent drawingFigure 1A~1B
  • EP2404583B1 patent drawingFigure 2
  • EP2404583B1 patent drawingFigure 3A~3B

AI summary

An apparatus for manufacturing an absorbent article, includes a processing device that, while a plurality of semi-finished products of the absorbent article is being transported in an aligned manner in a transport direction, processes the semi-finished product, and an inspecting device that, while the plurality of semi-finished products of the absorbent article is being transported in the aligned manner in the transport direction, inspects whether an actual processing position by the processing device is within an allowable range of the process target position on the semi-finished product. The inspecting device includes, a sensor section located at a predetermined position in the transport direction and outputting a detection signal while the actual processing position of the semi-finished product is being detected, a reference signal outputting section outputting a reference signal having a waveform in which one wavelength is equivalent to a unit transport amount corresponding to a single semi-finished product, the reference signal having a first waveform portion at a phase corresponding to the allowable range in the wavelength, and a determining section determining whether the actual processing position is within the allowable range by comparing the detection signal with the reference signal.