Absorption Testing Apparatus With Segmented Vacuum Pathway
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Solution Overview
Problem
Existing semiconductor testing apparatuses face challenges in ensuring reliable electrical connections and air tightness during vacuum absorption, which can affect the quality of testing and increase costs and testing time.
Innovation Solution
The absorption testing apparatus features a supporting platform with an embedded electrically conductive component that divides the pathway into an absorption area and an accommodating area, using elastic arms and sealing rings to isolate these areas and improve air tightness, allowing for efficient vacuuming without affecting the assembly quality of the electrical probe.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Device complexity
If the pathway is used for both vacuum absorption and electrical probe assembly, then the structure is simpler, but the air tightness cannot be ensured and additional testing is required
Solution Approach 1:
The pathway is divided into two separate areas: an absorption area for vacuum absorption and an accommodating area for electrical probe assembly. The plate with elastic arms acts as a partition wall separating these two areas, ensuring that the vacuum absorption process does not affect the electrical probe assembly while maintaining structural organization.
Solution Approach 2:
The plate with elastic arms serves as an intermediary structure between the absorption area and the accommodating area. It physically separates the two functional zones while allowing the vacuum pump to access the absorption area through the pathway, thus ensuring air tightness without compromising structural simplicity.
2Reliability
If additional air tightness tests are performed to ensure quality, then the reliability of testing is improved, but the testing time and costs increase
Solution Approach 1:
The plate with elastic arms and sealing ring are pre-installed to create an air-tight separation between the absorption area and accommodating area before the actual testing process begins. This preliminary structural arrangement ensures air tightness is built-in, eliminating the need for additional air tightness tests and reducing overall testing time while maintaining reliability.
3Ease of manufacture
If the electrical probe is assembled in the same area as vacuum absorption, then the assembly process is simpler, but the vacuum quality is affected by assembly quality
Solution Approach 1:
The pathway is segmented into an absorption area for vacuum absorption and an accommodating area for electrical probe assembly. This spatial segmentation allows the electrical probe to be assembled in a separate zone that is not affected by the vacuum absorption process, ensuring that assembly quality does not compromise vacuum quality while maintaining operational simplicity.
Solution Approach 2:
The plate with elastic arms acts as an intermediary barrier that isolates the accommodating area from the absorption area. This allows the electrical probe assembly to proceed independently without being influenced by the vacuum absorption process, thereby protecting vacuum quality while preserving assembly simplicity.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This solution enhances the air tightness and reduces the need for additional air tightness tests, thereby lowering costs and testing time while maintaining reliable electrical connections.
Implementation Method 1
The electrically conductive component includes a plate and a plurality of elastic arms. The elastic arms penetrate the plate. Each of the elastic arms has another end located in the accommodating area in order to electrically connect the probe heads.
Implementation Method 2
the carrier board is fixed to the supporting platform through a vacuum absorption manner to ensure the electrical connection between the carrier board and the pogo pins
Data Source
AI summary
An absorption testing apparatus supports a carrier board and includes a supporting platform, an electrically conductive component, a sealing ring and an electrical probe. The supporting platform has opposite top and bottom surfaces and a pathway penetrating through the top and bottom surfaces. The electrically conductive component, having a plate and elastic arms, is located in the pathway and is embedded in the supporting platform to divide the pathway into absorption and accommodating areas that are isolated by the plate. The elastic arms penetrate through the plate. The sealing ring, on the top surface, surrounds the absorption area and supports the carrier board. Each elastic arm has one end in the absorption area, electrically connecting to the carrier board. The electrical probe is located in the pathway and includes a body and probe heads. Each elastic arm has another end in the accommodating area, electrically connecting to the probe heads.