Integrated AC/DC Test Equipment for High-Power Transistors
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Solution Overview
Problem
Current test systems for high-power electronic components require separate hardware and complex interconnections for alternating-current (AC) and direct-current (DC) testing, leading to increased costs, complexity, and longer test times, especially for motor drive components used in automotive applications.
Innovation Solution
An automated test equipment (ATE) that integrates high-power AC and DC testing capabilities using a synchronized inductor switch module, high-precision, and high-speed digitizers to capture and analyze both AC and DC characteristics of high-power transistors like IGBTs, eliminating the need for separate test hardware and interconnections.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If separate hardware is used for AC and DC testing, then testing capability is comprehensive, but system hardware complexity and cost increase
Solution Approach 1:
The patent combines separate AC and DC testing hardware into a single integrated test system. The energy source unit, digitizers, and control modules are shared between AC and DC testing functions, eliminating redundant components while maintaining full testing capability for both signal types.
Solution Approach 2:
The test system is designed with universal components that can perform multiple functions. The energy source unit can provide both AC and DC power, the digitizers can capture both AC waveforms and DC parameters, and the switch module can route signals for different test types, making the hardware adaptable to various testing requirements.
2Adaptability or versatility
If separate hardware is used for AC and DC testing, then testing capability is comprehensive, but cost increases
Solution Approach 1:
By merging AC and DC testing functions into a single hardware platform, the patent reduces the total number of components required. This consolidation lowers manufacturing costs, reduces inventory requirements, and simplifies system integration while preserving comprehensive testing capabilities.
3Adaptability or versatility
If separate hardware is used for AC and DC testing, then testing capability is comprehensive, but test time increases
Solution Approach 1:
The integrated test system allows AC and DC testing to be performed sequentially or simultaneously using the same hardware resources. This eliminates the need to physically reconfigure or move between separate test systems, reducing setup time and enabling faster comprehensive testing of power electronic components.
4Measurement precision
If high-precision digitizer is used, then measurement precision is high, but system cost increases
Solution Approach 1:
The patent employs a high-precision digitizer that serves dual purposes: capturing high-resolution DC voltage measurements and acquiring AC waveform data. This single instrument performs multiple measurement functions with high accuracy, eliminating the need for separate precision measurement devices and reducing overall system cost while maintaining measurement excellence.
Data Source
AI summary
Aspects of the present application are directed to an automated test equipment (ATE) and methods for operating the same for testing high-power electronic components. The inventor has recognized and appreciated an ATE that provides both high-power alternating-current (AC) and direct-current (DC) testing in a single test system can lead to high throughput testing for high-power components with reduced system hardware complexity and cost. Aspects of the present application provide a synchronized inductor switch module and both a high-precision digitizer and a high-speed digitizer for capturing DC and AC characteristics of a high-power transistor.