Acid-Labile Monomer for High-Resolution Resist Patterning

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Solution Overview

Problem

Current positive resist compositions face challenges in achieving high sensitivity and resolution while minimizing acid diffusion, which leads to edge roughness and pattern collapse during fine pattern formation in photolithography, especially at the 5-nm node and beyond.

Innovation Solution

A polymerizable monomer with a specific acid-labile group structure, represented by the general formula (1), is used to form a polymer compound that enhances solvent solubility and acidity, reducing acid diffusion and improving pattern contrast and edge roughness, thereby enabling high-resolution patterning with KrF or ArF excimer laser, electron beam, or EUV lithography.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Manufacturing precision

If acid diffusion is minimized by decreasing temperature or PEB time, then resolution is improved, but sensitivity and contrast significantly decrease

Engineering Contradiction:
ImproveresolutionVSAvoidsensitivity and contrast
Core Design Contradiction:
Manufacturing precisionVSReliability

Solution Approach 1:

The patent changes the chemical parameters of the acid-labile group from conventional tertiary ester types to a novel structure with specific substitution patterns (formula 1), achieving optimized acid elimination reactivity that resolves the sensitivity-resolution trade-off

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The patent creates a composite acid-labile group structure combining specific aromatic substituents (formula 1) with the ester backbone, achieving synergistic effects that provide both high acid elimination reactivity and suppressed swelling behavior

Inventive Principle:
Principle #40Composite materials

2Manufacturing precision

If acid diffusion is suppressed by adding bulky acid generator, then resolution is improved, but edge roughness and pattern collapse increase

Engineering Contradiction:
ImproveresolutionVSAvoidedge roughness and pattern collapse
Core Design Contradiction:
Manufacturing precisionVSObject-generated harmful factors

Solution Approach 1:

The patent optimizes the chemical structure parameters of the acid-labile group to achieve moderate acid elimination reactivity, preventing both excessive acid diffusion and harmful swelling effects that cause edge roughness and pattern collapse

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The patent converts the potential harmful swelling behavior of carboxylic acid into a beneficial effect by designing the acid-labile group structure (formula 1) that eliminates acid with controlled reactivity, preventing pattern collapse while maintaining resolution

Inventive Principle:
Principle #22Blessing in disguise (Convert harm into benefit)

3Power

If conventional tertiary ester-type acid-labile group is used, then high acid elimination reactivity is achieved, but acid diffusion cannot be controlled and pattern collapse occurs

Engineering Contradiction:
Improveacid elimination reactivityVSAvoidacid diffusion and pattern collapse
Core Design Contradiction:
PowerVSObject-generated harmful factors

Solution Approach 1:

The patent introduces specific local structural features (formula 1) with particular substituents at defined positions, creating localized chemical environments that modulate acid elimination reactivity and suppress harmful swelling while maintaining high resolution

Inventive Principle:
Principle #3Local quality

Solution Approach 2:

The patent systematically varies the chemical parameters of the acid-labile group structure (formula 1) including substituent types and positions to achieve optimal balance between acid elimination reactivity and suppression of acid diffusion

Inventive Principle:
Principle #35Parameter changes

Data Source

PatentUS20230408921A1Polymerizable Monomer, Polymer Compound, Resist Composition, And Patterning Process
Publication Date: 2023.12.21 SHIN ETSU CHEMICAL CO LTD
  • US20230408921A1 patent drawing
  • US20230408921A1 patent drawing
  • US20230408921A1 patent drawing

AI summary

The present invention is a polymerizable monomer represented by the following general formula (1),wherein RA represents a hydrogen atom, a fluorine atom, a methyl group, or a trifluoromethyl group; ZL is a single bond or (backbone) —C(═O)—O—; RALU is an acid-labile group formed with an adjacent oxygen atom; XL represents an oxygen atom or a sulfur atom; Raa represents a hydrogen atom or a fluorine atom; R1a independently represents a hydrocarbyl group having 1 to 20 carbon atoms; n1 is an integer of 0 to 2; n2 is an integer of 1 or 2; n3 is an integer of 1 or 2; and n4 is an integer of 0 to 4.