Electrical Characteristic Acquiring Device Open Correction Calculation
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Solution Overview
Problem
Existing technologies face challenges in accurately acquiring an open correction value for electronic components, particularly when adjusting the interval between probes is difficult.
Innovation Solution
An electrical characteristic acquiring device calculates the open correction value based on measurement values taken at a set interval and the component's electrode side length, allowing for accurate acquisition without needing to adjust the probe interval.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If the interval between probes is adjusted to match the component electrode side length, then measurement accuracy is improved, but operation complexity increases
Solution Approach 1:
The patent replaces the mechanical adjustment of probe interval with a calculation-based approach. Instead of physically adjusting probes to match component dimensions, the system calculates the open correction value using the actual component electrode side length and a predetermined probe interval, eliminating the need for mechanical adjustment while maintaining measurement accuracy
Solution Approach 2:
The patent changes the approach from fixed physical geometry to variable calculated parameters. By using the formula that incorporates component electrode side length and predetermined probe interval, the system adapts to different component sizes without physical adjustment, resolving the contradiction between measurement precision and ease of operation
2Measurement precision
If open correction value is measured for each component change, then measurement accuracy is maintained, but productivity decreases
Solution Approach 1:
The patent performs preliminary calculation of the open correction value based on component electrode side length and predetermined probe interval before actual measurement. This preliminary action eliminates the need for repeated measurements when component changes occur, as the correction value can be pre-calculated and applied, thereby maintaining accuracy while improving productivity
Solution Approach 2:
The patent creates a computational model that copies the physical measurement process through calculation. Instead of physically measuring for each component, the system uses the calculated formula to replicate the open correction value, enabling rapid adaptation to different components without repeated physical measurements
Data Source
AI summary
An object of the present disclosure is to acquire an open correction value in a good manner. In an electrical characteristic acquiring device according to the present disclosure, an open correction value, which is an electrical characteristic when the interval between a pair of probes is the length of a component to be measured on an electrode side, is calculated based on the measurement value of the electrical characteristic when the interval between the pair of probes is a set length, a set length, and the length of the component on the electrode side. Therefore, even when it is difficult to adjust the interval between the pair of probes, the open correction value can be accurately acquired. In addition, it is not necessary to measure the open correction value every time the component to be measured is changed, and the work efficiency can be improved accordingly.