Actinic Ray-Sensitive Resin Composition for High Resolution

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Solution Overview

Problem

Current actinic ray-sensitive or radiation-sensitive resin compositions face challenges in achieving high resolution, particularly for miniaturized semiconductor elements, due to limitations in sensitivity and pattern formation with advanced exposure light sources like ArF excimer lasers and EUV light.

Innovation Solution

The development of an actinic ray-sensitive or radiation-sensitive resin composition that includes a resin with increased polarity through acid decomposition and a compound generating acid upon irradiation, featuring a repeating unit with two or more acid-decomposable groups and a phenolic hydroxyl group, optimized for high mass content and specific acid generation mechanisms.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Manufacturing precision

If conventional resin compositions are used with advanced exposure light sources (ArF excimer laser, EUV light), then miniaturization of semiconductor elements is enabled, but resolution is insufficient due to limitations in sensitivity and pattern formation

Engineering Contradiction:
ImproveresolutionVSAvoidsensitivity and pattern formation capability
Core Design Contradiction:
Manufacturing precisionVSReliability

Solution Approach 1:

The patent changes the chemical parameters of the resin by introducing specific repeating units with acid-decomposable groups (Formula A) and phenolic hydroxyl groups (Formula I). This modifies the resin's polarity and solubility characteristics, enabling better pattern formation and resolution with advanced exposure light sources while maintaining sensitivity

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The patent creates a composite resin system by combining multiple types of repeating units (Formula A with acid-decomposable groups, Formula I with phenolic hydroxyl groups, and Formula B without specific functional groups) in defined ratios. This composite structure achieves both high resolution and reliable sensitivity/pattern formation that individual resin components cannot provide alone

Inventive Principle:
Principle #40Composite materials

2Manufacturing precision

If the resin includes repeating units with acid-decomposable groups and phenolic hydroxyl groups, then dissolution contrast between exposed and unexposed areas is improved, but device complexity increases

Engineering Contradiction:
Improvedissolution contrastVSAvoidresin composition complexity
Core Design Contradiction:
Manufacturing precisionVSDevice complexity

Solution Approach 1:

The patent applies local quality by assigning specific functional roles to different repeating units within the resin: Formula A units provide acid-decomposable groups for polarity change, Formula I units provide phenolic hydroxyl groups for solubility control, and Formula B units provide structural backbone. This localized functional distribution achieves high dissolution contrast while managing composition complexity through clear functional segmentation

Inventive Principle:
Principle #3Local quality

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This composition enhances resolution by improving dissolution contrast between exposed and unexposed areas, enabling better pattern formation and electronic device manufacturing with advanced light sources.

Implementation Method 1

a compound that generates an acid upon irradiation with actinic rays or radiation

Methodology Applied
Scientific EffectPhotoacid generation: Photodissociation

Implementation Method 2

a resin of which polarity increases through decomposition by an action of an acid

Methodology Applied
Scientific EffectAcid decomposition: Hydrolysis

Data Source

PatentUS20230259029A1Actinic ray-sensitive or radiation-sensitive resin composition, resist film, pattern forming method, and method for manufacturing electronic device
Publication Date: 2023.08.17 FUJIFILM CORP
  • US20230259029A1 patent drawing
  • US20230259029A1 patent drawing
  • US20230259029A1 patent drawing

AI summary

An object of the present invention is to provide an actinic ray-sensitive or radiation-sensitive resin composition having an excellent resolution. In addition, another object of the present invention is to provide a resist film, a pattern forming method, and a method for manufacturing an electronic device, each relating to the actinic ray-sensitive or radiation-sensitive resin composition.The actinic ray-sensitive or radiation-sensitive resin composition of the embodiment of the present invention includes:a resin of which polarity increases through decomposition by the action of an acid; anda compound that generates an acid upon irradiation with actinic rays or radiation,in which the resin includes a resin including a repeating unit X1 having two or more groups of which polarity increases through decomposition by the action of an acid and a repeating unit X2 having a phenolic hydroxyl group.