Active-Area Test Switch Layout for Tiled Light-Emitting Displays
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Solution Overview
Problem
Traditional light emitting devices face a decrease in screen-to-body ratio due to the placement of test elements in non-display areas, affecting display quality and making it difficult to test light emitting elements effectively, especially in tiled displays.
Innovation Solution
The integration of test switch elements within the display area of the substrate allows for reduced peripheral space requirements, enabling improved screen-to-body ratio and effective testing of light emitting units without compromising the display effect.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If test elements are disposed in the non-display area of the light emitting device, then the testing function is provided, but the screen-to-body ratio decreases
Solution Approach 1:
The patent merges the test switch element with the display pixel structure by integrating it into the same pixel row or column. The test switch element shares the pixel electrode structure and connection pathways with display pixels, allowing testing functionality to be embedded within the display area without requiring separate peripheral test regions.
Solution Approach 2:
The pixel structure is designed to serve dual functions: display operation and testing. The same pixel electrode, transfer electrode, and connection structures are used for both driving display pixels and conducting test signals. The test switch element can be activated to route test signals through the data line to specific pixel columns, enabling the display structure to perform both its primary display function and testing function using shared components.
2Reliability
If test elements are disposed in the peripheral area, then the testing capability is maintained, but the display effect is compromised
Solution Approach 1:
The test switch element is merged with the display pixel structure by integrating it into the same pixel row or column. This integration ensures that the testing components are visually indistinguishable from display pixels, maintaining the uniformity and aesthetic quality of the display surface without creating visible test element structures that would compromise the display effect.
Solution Approach 2:
The test switch element is designed to visually match the appearance of surrounding display pixels. By using the same pixel electrode structure, connection pathways, and visual characteristics, the test element becomes indistinguishable from functional display pixels, allowing testing to occur without creating visual artifacts or compromising the overall display appearance.
3Area of stationary object
If test switch element is integrated in the display area, then the screen-to-body ratio is increased, but the wiring complexity increases
Solution Approach 1:
The data line serves dual purposes: it drives display pixels during normal operation and routes test signals to test switch elements during testing. The same data line infrastructure is used for both display driving and testing, eliminating the need for separate dedicated test signal lines and reducing overall wiring complexity despite the integrated layout.
Solution Approach 2:
The test switch element acts as an intermediary component that enables testing functionality through existing display infrastructure. By using the pixel electrode and transfer electrode structures as intermediaries, the patent routes test signals through the same pathways used for display operation, avoiding the need for complex dedicated test wiring while maintaining testing capability.
Data Source
AI summary
An electronic device including a substrate, an electronic unit, a data line, a control unit, a test pad and a test switch element is provided by the present disclosure. The substrate includes a first surface and a second surface opposite to the first surface, wherein the first surface includes an active area. The electronic unit is disposed on the substrate and located in the active area. The data line is disposed on the substrate. The control unit is disposed on the substrate and located in the active area, and the control unit is electrically connected between the electronic unit and the data line. The test pad is disposed on the second surface of the substrate. The test switch element is disposed on the substrate and located in the active area, and the test switch element is electrically connected between the data line and the test pad.