Active Matrix Substrate Independent Common Lines Inspection
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Solution Overview
Problem
Conventional LCD manufacturing processes face challenges in effectively inspecting short defects between pixel electrodes, leading to color-shift issues and reduced yield rates due to the inability to identify slight voltage differences during array inspection.
Innovation Solution
The implementation of an active matrix substrate with independent common line patterns and a corresponding inspection method that applies different voltage levels or wave patterns to these patterns to increase voltage differences between pixel electrodes, allowing for the detection of short circuits and defects.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If conventional array inspection methods are used, then the inspection process is simple, but short defects between pixel electrodes cannot be effectively detected
Solution Approach 1:
The common voltage line is segmented into multiple independent common line patterns (first common line pattern, second common line pattern, etc.) that can be independently controlled. This segmentation allows different voltage levels to be applied to different regions, enabling detection of short defects between pixel electrodes by observing abnormal voltage distribution patterns.
Solution Approach 2:
Different voltage levels are applied to different common line patterns to create detectable voltage differences. By changing the voltage parameter across different regions, the inspection method can detect short defects that would be invisible under uniform voltage conditions.
2Reliability
If multiple independent common line patterns are implemented, then defect inspection capability is improved, but device structure becomes more complex
Solution Approach 1:
The multiple common line patterns serve dual functions: they maintain common voltage distribution during normal display operation and enable defect inspection during manufacturing. This multi-functionality allows the same structure to support both display functionality and quality inspection without requiring separate dedicated inspection structures.
Solution Approach 2:
Different regions of the common line patterns can have different voltage levels applied locally, allowing targeted inspection of specific pixel electrode regions. Each common line pattern can be independently controlled to create local voltage differences that reveal short defects in specific areas.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach enables effective inspection of defects in the active matrix substrate and LCDs, improving yield rates, reducing manufacturing costs, and enhancing the quality of LCD panels by identifying and addressing issues before final assembly.
Implementation Method 1
the capacitance coupling effect between each pixel electrode and each common line pattern are different
Data Source
AI summary
An active matrix substrate including a substrate, a plurality of scan lines, a plurality of data lines, a plurality of independent common line patterns, and a plurality of pixels is provided. The scan lines, data lines, and common line patterns are disposed on the substrate. The pixels are arranged in array on the substrate, wherein each pixel is electrically connected to corresponding scan line and data line, and the common line patterns are distributed under each pixel. Each pixel includes a plurality of active components and a plurality of pixel electrodes. Each of the pixel electrodes is electrically connected to corresponding scan line and data line through different active components. The capacitance coupling effect between each of the pixel electrodes and common line patterns are different. Additionally, an inspection method for the active matrix substrate and a liquid crystal display having the active matrix substrate are further provided.