Active Matrix Substrate Broken Line Repair Method
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
The manufacturing of liquid crystal display devices is hindered by defects in active matrix substrates, such as broken lines in gate and source lines, leading to reduced yield and defective displays due to the inability to apply normal voltage to pixel electrodes.
Innovation Solution
A repair method for active matrix substrates that involves inspecting for broken lines and forming repair sections using adjacent lines, with laser radiation and nano metal solutions to reconnect and harden the repair sections, allowing for the restoration of functional pathways for signal transmission.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Area of stationary object
If gate lines and source lines are made very long to cover the display area, then the display area is increased, but the risk of broken lines increases
Solution Approach 1:
The patent introduces a broken line repair section that divides the continuous gate line into segments. When a break occurs, the repair section provides an alternative conductive path that bypasses the broken segment, effectively segmenting the line to prevent complete failure while maintaining overall line functionality across the large display area.
Solution Approach 2:
The broken line repair section is pre-formed during manufacturing before any breaks occur. This preliminary structure is prepared in advance so that when a break happens, the repair pathway is already in place and can be activated immediately without requiring complex post-manufacturing repairs.
2Productivity
If broken lines are not repaired, then the manufacturing process is simple, but the manufacturing yield decreases
Solution Approach 1:
The substrate structure is designed to be self-repairing through the broken line repair section. When a break occurs in the gate line or source line, the repair section automatically provides an alternative conductive pathway without requiring external intervention or complex repair processes, thereby maintaining high manufacturing yield while adding minimal structural complexity.
Solution Approach 2:
The broken line repair section acts as a pre-prepared protective measure that cushions against the harmful effect of line breaks. By having this repair pathway in place beforehand, the system can withstand line breaks without compromising manufacturing yield, effectively cushioning against potential defects.
3Reliability
If a broken gate line is not repaired, then no additional processing is needed, but voltage cannot be applied to pixel electrodes
Solution Approach 1:
The broken line repair section serves as an intermediary conductive pathway between the gate line and the pixel electrodes. When the primary gate line is broken, the repair section mediates the electrical connection, allowing voltage to be applied to the pixel electrodes through the alternative path without requiring complex manufacturing processes or additional wiring.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This method improves the manufacturing yield of liquid crystal display devices by enabling the repair of broken lines, ensuring smooth signal transmission and reducing defects, thereby enhancing display quality.
Implementation Method 1
the connection portions of the repair sections are coated with nano metal solution, and the nano metal solution is radiated by laser to be hardened
Implementation Method 2
the nano metal solution is radiated by laser to be hardened for conduction
Data Source
AI summary
The present disclosure illustrates a repair method for an active matrix substrate. The repair method includes steps: performing the broken-line inspection process to inspect whether the broken line exists on the first and second gate lines; if one first gate line is inspected to be broken, performing a source line repair-section forming process to cut off the cut portions of the second source lines disposed at two sides of a pixel electrode corresponding to a broken location of the first gate line, to form source line repair sections overlapping with the broken first gate line and the second gate line; performing a gate line repair-section forming process on the second gate line, adjacent to the broken first gate line, to cut off the cut portions of the second gate line to form a gate line repair section overlapping with the second source lines; and performing a connection process.