Active Routing Circuit for High-Speed ATE Channel Switching
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Solution Overview
Problem
Current automated test equipment (ATE) faces challenges in handling the increasing number of test pins and high-speed testing of multi-chip-packages, due to limitations in pin count, reliability, and cost associated with mechanical relays, as well as the need for efficient parallel testing of multiple devices.
Innovation Solution
The implementation of an active routing circuit with channel switches and transceivers that can dynamically switch between driver and receiver modes, allowing for efficient routing of test channels to multiple device under test pins, reducing the need for mechanical relays and improving signal integrity and reliability.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If mechanical relays are used for routing test channels, then signal routing capability is provided, but reliability deteriorates and device complexity increases
Solution Approach 1:
The patent replaces mechanical relays with electronic transceivers and solid-state switching circuits. The transceiver includes a driver circuit, receiver circuit, and solid-state switch that electronically route test signals without mechanical moving parts, thereby improving reliability while maintaining signal routing capability.
Solution Approach 2:
The patent introduces an active routing circuit as an intermediary between the test channel and device under test. This routing circuit includes transceivers that can dynamically switch between transmitting and receiving modes, providing flexible signal routing without requiring mechanical relay systems.
2Adaptability or versatility
If the number of test pins is increased to handle large pin-count packages, then testing capability is improved, but cost and device complexity increase
Solution Approach 1:
The patent makes test channels universal by implementing transceivers that can dynamically switch between driver and receiver modes. A single test channel can be reconfigured to test different pins and devices through the active routing circuit, allowing one channel to perform multiple testing functions rather than requiring dedicated channels for each pin.
Solution Approach 2:
The patent implements dynamic routing where transceivers can switch between transmitting and receiving modes based on test requirements. This dynamic reconfiguration allows the same hardware infrastructure to adapt to different testing scenarios, reducing the need for fixed, dedicated test channels for each pin.
3Productivity
If parallel testing of multiple devices is implemented, then productivity is improved, but the number of test pins and system complexity increase
Solution Approach 1:
The patent segments the testing system into multiple independent test channels, each with its own transceiver and routing capability. This segmentation allows parallel testing of multiple devices while keeping each channel's complexity manageable, as each channel operates independently with standardized transceiver interfaces.
4Productivity
If high-speed testing is implemented, then productivity is improved, but signal integrity deteriorates due to parasitic effects
Solution Approach 1:
The patent replaces mechanical relays with solid-state electronic switching circuits that have minimal parasitic inductance and capacitance. The solid-state switch and electronic transceiver design enables high-speed signal transmission while maintaining signal integrity by eliminating the parasitic effects associated with mechanical contact systems.
Data Source
AI summary
An active routing circuit. In representative embodiments, the active routing circuit includes a channel switch which includes a transceiver and a switch. The transceiver has first data line, second data line, drive/receive control line, and receiver select control line. The switch has first contact connected to first data line, second contact connected to second data line, and switch control line. In a driver mode, the transceiver can receive data from first data line and output that data to second data line, and in receiver mode, can receive data from second data line and output that data to first data line. The transceiver can switch between driver mode and receiver mode in response to a signal. Data received from the second data line can be blocked in response to another signal. The switch can shift between connecting and disconnecting first contact to/from second contact in response to yet another signal.


