Active Silicon Package Stacking With Interposer Heat Paths

Resolve Bottlenecks,
Find Innovative Solutions
Generate Solutions

Solution Overview

Problem

Package-on-package (PoP) semiconductor stacks face challenges with heat dissipation due to reduced heat transfer, leading to hot spots and premature failure, as existing technologies struggle to effectively manage thermal conductivity across stacked packages.

Innovation Solution

A package-on-silicon (PoS) semiconductor package design where a first semiconductor package is conductively coupled to an active silicon substrate using interconnects in a high-density pattern, and a second semiconductor package is coupled using conductive members or wirebonds in a lower-density pattern, with an optional interposer layer for thermal conductivity enhancement, facilitating heat dissipation through a high thermal conductivity adhesive.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Area of stationary object

If semiconductor packages are stacked vertically in PoP configuration, then board area is reduced and signal propagation is improved, but heat dissipation is reduced leading to hot spots and premature failure

Engineering Contradiction:
Improveboard areaVSAvoidheat dissipation
Core Design Contradiction:
Area of stationary objectVSTemperature

Solution Approach 1:

An interposer substrate is introduced as an intermediary component between the stacked semiconductor packages. The interposer contains through-silicon vias (TSVs) that serve as thermal pathways, mediating heat transfer from upper to lower packages while maintaining the compact PoP vertical stacking configuration on the board

Inventive Principle:
Principle #24Intermediary (Mediator)

Solution Approach 2:

The patent employs composite material structures including the interposer substrate combining silicon layers with conductive via materials, and thermal interface materials with high thermal conductivity. This composite approach creates optimized thermal pathways that dissipate heat effectively while maintaining the compact stacked package structure

Inventive Principle:
Principle #40Composite materials

2Strength

If packages are physically and conductively coupled via reforming, then mechanical and electrical connection is achieved, but heat transfer is reduced within the stack

Engineering Contradiction:
Improvemechanical and electrical connectionVSAvoidheat transfer
Core Design Contradiction:
StrengthVSLoss of energy

Solution Approach 1:

The interposer substrate acts as a thermal intermediary that redirects heat flow. While mechanical coupling provides electrical connection, the TSVs embedded in the interposer create dedicated thermal pathways that bypass the limitations of direct package-to-package thermal coupling, enabling efficient heat extraction without compromising mechanical strength

Inventive Principle:
Principle #24Intermediary (Mediator)

Solution Approach 2:

The patent transitions from planar heat dissipation to three-dimensional thermal management by utilizing vertical TSV pathways through the interposer. This dimensional approach creates additional thermal conduction routes that extend through the stacked package structure, improving heat transfer in the vertical dimension while maintaining mechanical coupling

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

3Area of stationary object

If heat is dissipated through a relatively small area in PoP stack, then compact structure is maintained, but hot spots form and reliability decreases

Engineering Contradiction:
Improveheat dissipation areaVSAvoidpackage reliability
Core Design Contradiction:
Area of stationary objectVSReliability

Solution Approach 1:

The thermal management system is segmented into multiple independent heat dissipation pathways through the TSV array in the interposer. Rather than relying on a single heat sink, the segmented via structure distributes thermal load across multiple parallel conduction paths, preventing localized hot spots and improving overall package reliability

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The interposer provides localized thermal management quality by concentrating high thermal conductivity materials specifically at critical heat generation points within the stack. The TSVs are strategically positioned to address local hot spots, creating non-uniform thermal conductivity distribution that optimizes heat extraction from high-power regions while maintaining compact overall structure

Inventive Principle:
Principle #3Local quality

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This design enhances thermal distribution and heat dissipation across the PoP semiconductor package, reducing the risk of hot spots and extending the lifespan of the package by effectively managing thermal conductivity between stacked components.

Implementation Method 1

heat dissipation through a high thermal conductivity adhesive

Methodology Applied
Scientific EffectThermal conductivity: Conduction (thermal)

Data Source

PatentUS11978727B2Package on active silicon semiconductor packages
Publication Date: 2024.05.07 INTEL CORP
  • US11978727B2 patent drawing
  • US11978727B2 patent drawing
  • US11978727B2 patent drawing

AI summary

Systems and methods for providing a low profile stacked die semiconductor package in which a first semiconductor package is stacked with a second semiconductor package and both semiconductor packages are conductively coupled to an active silicon substrate that communicably couples the first semiconductor package to the second semiconductor package. The first semiconductor package may conductively couple to the active silicon substrate using a plurality of interconnects disposed in a first interconnect pattern having a first interconnect pitch. The second semiconductor package may conductively couple to the active silicon substrate using a plurality of interconnects disposed in a second interconnect pattern having a second pitch that is greater than the first pitch. The second semiconductor package may be stacked on the first semiconductor package and conductively coupled to the active silicon substrate using a plurality of conductive members or a plurality of wirebonds.