Actuator Test Profile Control for Dynamic Null Pacing
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Existing test devices require numerous iterations to optimize test profiles, leading to prolonged testing times due to dynamic null pacing, which occurs when actual and commanded sensor-detectable conditions differ significantly, necessitating a guess-and-check approach to avoid this issue.
Innovation Solution
A method and system that analyzes actual transition times during testing, adjusts segment lengths based on identified null pacing occurrences, and iteratively optimizes the test profile by shortening or lengthening segments to minimize null pacing, allowing for rapid convergence to an optimized profile.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If dynamic null pacing is applied to ensure valid test data when actual and commanded conditions differ significantly, then measurement precision is improved, but testing time increases substantially
Solution Approach 1:
The system performs preliminary actions by pre-calculating and storing expected sensor values and transition timings before the actual test runs. During test execution, the system compares actual sensor readings against these pre-calculated expectations to proactively identify segments requiring null pacing, allowing optimization in subsequent iterations without compromising data validity in the current run
Solution Approach 2:
The system implements feedback by continuously monitoring actual sensor-detectable conditions during test execution and comparing them against commanded conditions. When deviations exceed thresholds indicating potential null pacing events, the system feeds this information back to adjust segment timings in real-time or in subsequent iterations, balancing data validity with testing efficiency
2Productivity
If segment lengths are adjusted through multiple iterations to optimize test profile and eliminate null pacing, then productivity is improved, but the number of iterations required increases testing time
Solution Approach 1:
The system performs preliminary analysis of test data from previous iterations, pre-identifying segments where null pacing occurred and calculating optimal adjusted segment lengths before the next iteration begins. This pre-processing of optimization data eliminates the need for extensive trial-and-error iterations, directly improving productivity while reducing the time spent in iterative cycles
Solution Approach 2:
The system systematically changes segment length parameters based on analyzed performance data from previous iterations. By identifying the specific parameter adjustments (segment durations) that eliminated null pacing in prior runs, the system applies targeted parameter changes in subsequent iterations, achieving optimization faster than exhaustive search methods
3Adaptability or versatility
If users manually specify segment length increments to optimize profile, then adaptability is improved, but device complexity increases due to manual configuration requirements
Solution Approach 1:
The system performs self-service by automatically analyzing test execution data, identifying null pacing events, calculating optimal segment length adjustments, and implementing profile optimizations without requiring manual user configuration. This automation maintains adaptability to different test scenarios while eliminating the complexity of manual setup, as the system adapts profiles based on observed performance rather than predefined user specifications
Data Source
AI summary
A method of optimizing a test profile for testing an item includes performing a test iteration by changing a sensor-detectable condition of the item using actuator(s) according to an iteration of the test profile, measuring an actual sensor-detectable condition during the test iteration, identifying a first segment of the test profile specifying a first segment transition in which dynamic null pacing occurred when executing the first segment during the test iteration, measuring a first duration that is an actual length of a segment transition for the channel during the test iteration corresponding to a specified segment transition of the first segment, increasing a length of the first segment to be equal to the first duration in a first adjusted iteration of the test profile, and performing another test iteration by changing the sensor-detectable condition of the item using the actuator(s) according to the first adjusted iteration of the test profile.