A/D Converter Test Circuit for Sample-Hold Retention Checks
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Solution Overview
Problem
Current A/D conversion circuit testing methods do not adequately assess the retention characteristics of sample hold circuits and the overall A/D conversion operation, including previous circuits, which is crucial for high accuracy motor control in automotive systems.
Innovation Solution
An A/D conversion circuit with multiple transmission paths and switches that allow for selective output of signal and reference voltages, along with a hold circuit and a second switch for output voltage selection, enabling comprehensive testing of A/D conversion operations, including sequential voltage retention characteristics.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If conventional A/D conversion circuit testing methods are used, then the testing process is simple, but the retention characteristics of sample hold circuits and previous circuits cannot be adequately assessed
Solution Approach 1:
The A/D conversion circuit is divided into multiple independent transmission paths (first transmission path, second transmission path, third transmission path), each capable of being tested separately. This segmentation allows comprehensive testing of different circuit components including sample hold circuits and previous stages without requiring complete circuit operation, thereby improving reliability assessment while managing complexity through modular testing.
Solution Approach 2:
The test circuit is designed with multi-functionality to perform various testing operations through different path configurations. The same circuit structure can test A/D conversion characteristics, sample hold retention characteristics, and previous circuit characteristics by selectively activating different transmission paths and switches, eliminating the need for separate dedicated test circuits for each function.
2Measurement precision
If multiple transmission paths and switches are added for comprehensive testing, then retention characteristics can be assessed, but the device complexity increases
Solution Approach 1:
Multiple transmission paths and testing functions are merged into a single integrated test circuit structure. The first, second, and third transmission paths share common components such as the A/D conversion unit, reference voltage sources, and control logic. This merging approach enables comprehensive testing with improved measurement precision while minimizing the increase in device complexity through resource sharing and functional integration.
3Reliability
If conventional testing without multiple paths is used, then the circuit structure remains simple, but the overall A/D conversion operation including previous circuits cannot be thoroughly tested
Solution Approach 1:
The test circuit enables preliminary testing of previous circuits and sample hold circuits before actual A/D conversion operations. By providing dedicated transmission paths that can be activated independently, the system allows comprehensive pre-testing of all circuit stages including input circuits, sample hold circuits, and reference voltage circuits, ensuring complete reliability assessment before full operation.
Data Source
AI summary
An electric device includes first, second and third selectors. A first node connects to a first input of the first selector, a second node connects to a first input of the second selector, a third node connects to a second input of the first selector, and a fourth node connects to a second input of the second selector. A first switch connects to the first node, and a second switch connects to the second node. A first capacitor connects between the first switch and the third node, and a second capacitor connects between the second switch and the fourth node. A fifth node connects between an output of the first selector and a first input of the third selector, and a sixth node connects between an output of the second selector and a second input of the third selector. An A/D converter connects to an output of the third selector.