Adapter Tip Relay Optics for APC Trans-Duplex Fiber Inspection

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Solution Overview

Problem

Existing optical-fiber connector endface inspection microscopes struggle to inspect both non-parallel angled-polished endfaces of duplex optical-fiber connectors simultaneously, as conventional adapter tips cannot handle diverging inspection light pathways from these connectors.

Innovation Solution

An adapter tip with relay optics, comprising optical prisms or wedges, is designed to realign inspection light from both endfaces onto a single imaging path, allowing both endfaces to be imaged within the field of view of the inspection microscope, even if they are angled differently, by tilting refracting plane surfaces to align light beams with the optical axis.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If the inspection microscope is tilted at an 8-degree angle to inspect APC connector endfaces, then the inspection light can illuminate the endface in a direction normal to the angled-polished endface, but it becomes impossible to insert the microscope without disconnecting neighbor optical fibers in dense environments

Engineering Contradiction:
Improveinspection accuracyVSAvoidease of insertion
Core Design Contradiction:
Measurement precisionVSEase of operation

Solution Approach 1:

The patent introduces an adapter tip as an intermediary component between the inspection microscope and the APC connector. The adapter tip includes optical elements (lenses or prisms) that redirect the inspection light path, allowing the microscope to remain in a straight, non-tilted position while still achieving normal illumination of the angled endface. This mediator enables both accurate inspection and easy insertion without disconnecting neighboring fibers.

Inventive Principle:
Principle #24Intermediary (Mediator)

2Quantity of substance

If conventional adapter tips are used to inspect single-fiber or multi-fiber connectors, then one fiber or multiple fibers can be inspected, but two non-parallel angled-polished endfaces of a duplex connector cannot be imaged simultaneously

Engineering Contradiction:
Improvenumber of fibers inspectedVSAvoidcompatibility with duplex APC connectors
Core Design Contradiction:
Quantity of substanceVSAdaptability or versatility

Solution Approach 1:

The adapter tip is segmented into multiple independent optical channels, with each channel equipped with optical elements designed to capture light from a specific endface angle. This segmentation allows each channel to handle one endface independently while the adapter tip as a whole can inspect both endfaces of a duplex APC connector simultaneously, achieving both quantity and versatility.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The adapter tip is designed with multi-functionality to handle various connector types. It can inspect single-fiber connectors, multi-fiber connectors, and duplex APC connectors with non-parallel endfaces. The universal design includes optical elements that can be configured to capture different light angles, making the same adapter tip applicable to multiple connector configurations without requiring different specialized tips.

Inventive Principle:
Principle #6Universality (Multi-functionality)

3Loss of time

If a single connection is made to inspect both endfaces of a duplex connector, then connection time is reduced, but existing adapter tips cannot achieve imaging of both non-parallel endfaces simultaneously

Engineering Contradiction:
Improveconnection timeVSAvoidimaging capability
Core Design Contradiction:
Loss of timeVSMeasurement precision

Solution Approach 1:

The adapter tip merges multiple optical paths into a single connection interface. By combining the optical elements and light paths for both endfaces within one adapter tip, the system can inspect both non-parallel endfaces simultaneously through a single connection, reducing connection time while maintaining full imaging capability for both endfaces.

Inventive Principle:
Principle #5Merging (Combining)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Enables concurrent imaging of both optical-fiber endfaces, ensuring accurate inspection without the need to tilt the microscope, thus preventing dust contamination and mechanical stress, and allows for focus adjustment to capture clear images of each endface separately if necessary.

Implementation Method 1

relay optics defining two imaging paths (one for each optical-fiber endface), wherein each imaging path comprises at least one optical component (e.g., parallelepiped-like optical prism) used to realign inspection light from each endface towards the optical fiber axis

Methodology Applied
Scientific EffectRefraction: Refraction

Data Source

PatentUS20240255713A1Adapter tip and microscope system for inspecting APC trans-duplex fiber-optic connectors
Publication Date: 2024.08.01 EXFO
  • US20240255713A1 patent drawing
  • US20240255713A1 patent drawing
  • US20240255713A1 patent drawing

AI summary

There is provided an adapter tip to be employed with an optical-fiber connector-endface inspection microscope device and an optical-fiber connector endface inspection microscope system suitable for imaging two non-parallel APC optical-fiber endfaces of a duplex (i.e., APC trans-duplex) optical-fiber connector. Because the two optical-fiber endfaces of an APC trans-duplex connector are angled-polished (APC) in different directions (non-parallel), inspection light reflected on the two endfaces take diverging pathways. A single-fiber or multi-fiber inspection microscope therefore cannot allow inspection of both optical-fiber endfaces at once. The proposed adapter tip or microscope system comprises relay optics defining two imaging paths (one for each optical-fiber endface), wherein each imaging path comprises at least one optical component (e.g., an optical prism) used to deviate inspection light from each endface towards the optical axis of the objective lens, such that both endfaces may be imaged within the field of view of the inspection microscope.