Self-Adaptive Circuit Tester for Warped Boards

Resolve Bottlenecks,
Find Innovative Solutions
Generate Solutions

Solution Overview

Problem

Circuit board testers face challenges in reliably testing warped or uneven boards without damaging them, as existing solutions often require excessive pressure that can damage the testing device or the board.

Innovation Solution

A self-adaptive circuit tester system with orthogonally slideable and lockable retaining fingers that adjust to the board's unevenness, using a combination of mechanical and actuable components to ensure reliable alignment and even pressure application, preventing damage to the board during testing.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If sufficient pressure is applied to flatten warped circuit boards during testing, then probe contact reliability is improved, but the circuit board may be damaged

Engineering Contradiction:
Improveprobe contact reliabilityVSAvoidboard damage
Core Design Contradiction:
ReliabilityVSObject-affected harmful factors

Solution Approach 1:

The fixture employs a spring-loaded mechanism that allows the pressing surface to dynamically adapt to the board's warpage. The spring force provides sufficient pressure for probe contact while automatically adjusting to board unevenness, preventing excessive force that would cause damage. This dynamic system resolves the contradiction by making the pressure application both reliable and protective.

Inventive Principle:
Principle #15Dynamics

Solution Approach 2:

The invention changes the pressure parameter from a fixed high value to a variable value that adapts to board conditions. The spring constant and pre-load are carefully selected to provide adequate contact force for reliable probing while remaining below the threshold that causes board damage. This parameter optimization resolves the contradiction between contact reliability and board protection.

Inventive Principle:
Principle #35Parameter changes

2Productivity

If fixed pressure is applied to warped circuit boards, then testing speed is maintained, but positioning accuracy deteriorates

Engineering Contradiction:
Improvetesting speedVSAvoidpositioning accuracy
Core Design Contradiction:
ProductivityVSManufacturing precision

Solution Approach 1:

The spring-loaded pressing mechanism allows the fixture to quickly adapt to board warpage without requiring manual adjustment. The dynamic compliance of the spring system enables rapid positioning while maintaining accurate probe contact, thus preserving both testing speed and positioning accuracy simultaneously.

Inventive Principle:
Principle #15Dynamics

3Reliability

If high pressure is used to ensure probe contact on uneven boards, then contact reliability is improved, but device durability deteriorates

Engineering Contradiction:
Improvecontact reliabilityVSAvoiddevice durability
Core Design Contradiction:
ReliabilityVSDuration of action of stationary object

Solution Approach 1:

The spring constant is selected to provide adequate contact force for reliable probing while limiting the maximum force to levels that do not damage the testing device. This optimized parameter choice ensures both contact reliability and device durability over extended operational periods.

Inventive Principle:
Principle #35Parameter changes

Data Source

PatentUS9772349B1Circuit board testing device for uneven circuit boards
Publication Date: 2017.09.26 CIRCUIT CHECK
  • US9772349B1 patent drawing
  • US9772349B1 patent drawing
  • US9772349B1 patent drawing

AI summary

A circuit board tester and method that precisely aligns the probe plate and circuit board is disclosed. With a circuit board and probe plate mounting within a housing having a top and bottom, hinged together, at closure there may be slight misalignments of the two. By making one of the two plates floating, or laterally slideable with respect to each other, it is possible to make final alignment at closure. One of the two plates can be provided with a pin and the other with a pin receiving alignment block. With the lateral slideability, the pin and block can insure proper probe alignment. Additional systems for correcting misaligned pins or blocks are also disclosed.