Adaptive Clock Generation Using Delay Chains for PVT Tracking

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Solution Overview

Problem

Conventional clock generation circuits in semiconductor manufacturing are limited by variability in manufacturing processes and operating conditions, leading to suboptimal performance and the need for crystal frequency references, which are costly and space-intensive.

Innovation Solution

A clock generation circuit that tracks the critical path across process, voltage, and temperature variations using multiple delay chains modeling different delay characteristics, combining their outputs to produce a variable clock signal that adapts to manufacturing and operating conditions, reducing the need for crystal oscillation sources.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If a fixed maximum clock frequency is specified after qualification testing to ensure reliable operation across all process variations and operating conditions, then reliability is improved, but productivity deteriorates because the clock frequency is lower than what any given integrated circuit can actually achieve under its specific operating conditions

Engineering Contradiction:
Improvereliable operationVSAvoidoperating frequency
Core Design Contradiction:
ReliabilityVSProductivity

Solution Approach 1:

The patent applies dynamics by transitioning from a fixed clock frequency to a variable clock frequency that adapts to actual operating conditions. The system dynamically adjusts the clock frequency based on real-time measurements of process, voltage, and temperature variations, allowing each integrated circuit to operate at its optimal frequency rather than being constrained by a worst-case fixed frequency determined during qualification testing.

Inventive Principle:
Principle #15Dynamics

Solution Approach 2:

The patent implements feedback mechanisms that continuously monitor operating conditions (process variations, voltage levels, temperature) and use this information to adjust the clock frequency accordingly. This closed-loop feedback system enables the clock frequency to self-optimize based on actual circuit performance and environmental conditions, resolving the contradiction between reliability and productivity.

Inventive Principle:
Principle #23Feedback

2Stability of the object's composition

If crystal frequency references are used to provide a stable clock signal, then stability of the clock signal is improved, but device complexity and cost increase due to the additional components and space requirements

Engineering Contradiction:
Improveclock signal stabilityVSAvoidcircuit complexity
Core Design Contradiction:
Stability of the object's compositionVSDevice complexity

Solution Approach 1:

The patent extracts and eliminates the crystal frequency reference component from the system. Instead of relying on external crystal oscillators, the invention uses on-chip delay elements and logic circuits to generate the clock signal directly from the integrated circuit's own operating characteristics. This removal of the crystal component reduces device complexity, cost, and space requirements while maintaining clock signal stability through adaptive frequency adjustment.

Inventive Principle:
Principle #2Taking out (Extraction)

Solution Approach 2:

The patent enables the integrated circuit to generate its own clock signal using internal delay elements and logic circuits that are already present on the chip. The system serves itself by utilizing its own operating parameters (delay characteristics, voltage, temperature) to produce a stable and optimized clock signal, eliminating the need for external crystal references and reducing overall system complexity.

Inventive Principle:
Principle #25Self-service

Data Source

PatentUS9602083B2Clock generation circuit that tracks critical path across process, voltage and temperature variation
Publication Date: 2017.03.21 NVIDIA CORP
  • US9602083B2 patent drawing
  • US9602083B2 patent drawing
  • US9602083B2 patent drawing

AI summary

Clock generation circuit that track critical path across process, voltage and temperature variation. In accordance with a first embodiment of the present invention, an integrated circuit device includes an oscillator electronic circuit on the integrated circuit device configured to produce an oscillating signal and a receiving electronic circuit configured to use the oscillating signal as a system clock. The oscillating signal tracks a frequency-voltage characteristic of the receiving electronic circuit across process, voltage and temperature variations. The oscillating signal may be independent of any off-chip oscillating reference signal.