Adaptive Diagnostic Testing for Computer Boot Time Reduction
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Solution Overview
Problem
Diagnostic testing during the boot process of computer systems significantly prolongs boot time, as existing methods require extensive testing regardless of system health, leading to inefficiencies and unnecessary delays.
Innovation Solution
An adaptive diagnostic testing method that selectively performs tests based on error thresholds and historical data, running diagnostics only on modules with errors or during initial periods, and dynamically adjusts test execution to minimize boot time without compromising test coverage.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If diagnostic testing is performed during the boot process, then system reliability is improved by detecting faults, but boot time is significantly prolonged
Solution Approach 1:
The diagnostic testing approach transitions from a static, fixed testing protocol to a dynamic, adaptive testing strategy. The system dynamically adjusts testing based on real-time conditions including error thresholds, component health status, and boot sequence phase, thereby reducing unnecessary testing time while maintaining reliability when needed.
Solution Approach 2:
The invention changes key parameters of the diagnostic testing process including test selection criteria, testing depth, and execution timing based on system state. By modifying these parameters adaptively rather than following a fixed protocol, the system reduces boot time while maintaining adequate testing coverage for reliability.
2Measurement precision
If extensive diagnostic testing is performed on all system components, then test coverage is improved, but boot time increases significantly
Solution Approach 1:
Instead of applying uniform testing to all system components, the invention implements localized testing strategies where different components receive different levels of testing based on their individual risk profiles, error histories, and criticality. This allows comprehensive testing of high-risk components while reducing or skipping testing of low-risk components, thereby maintaining test coverage where needed and reducing overall boot time.
Solution Approach 2:
The diagnostic testing process is segmented into distinct phases and components rather than executing all tests uniformly. The system divides testing into critical path tests that must be run and optional tests that can be skipped, allowing the boot process to complete quickly by executing only essential diagnostic functions.
3Reliability
If diagnostic testing is performed on all memory modules, then memory reliability is improved, but boot time is extended
Solution Approach 1:
The memory testing approach applies local quality by differentiating between memory modules based on their individual characteristics including error counts, age, and operational status. Modules with higher risk profiles receive comprehensive testing while modules with clean error histories receive reduced or no testing, thereby maintaining memory reliability where needed and reducing overall boot time.
Solution Approach 2:
Instead of performing complete diagnostic testing on all memory modules, the invention applies partial testing to only those modules that require it based on error thresholds and risk assessment. This partial action approach maintains adequate reliability for problematic modules while avoiding unnecessary testing time on healthy modules.
4Loss of time
If adaptive diagnostic testing is implemented, then boot time is reduced by minimizing unnecessary tests, but system complexity increases
Solution Approach 1:
The adaptive diagnostic testing system implements self-service by automatically making decisions about which tests to execute based on pre-established criteria including error thresholds, component health data, and boot sequence phase. This automation eliminates the need for manual configuration and complex user-side logic, reducing the practical complexity burden while still achieving adaptive testing behavior that reduces boot time.
Data Source
AI summary
A method and system for performing diagnostic testing to speed the computer boot process. A boot process is initiated and an error counter value is read in any of memory, input/output, central processing, networking, mass storage, or other computing subsystems. The error counter values are compared to subsystem error thresholds. The method includes identifying subsets of subsystems with error counters exceeding error thresholds and then, performing diagnostic tests only on this subset of subsystems as part of the boot process. The error counter may be a correctable error counter that is incremented by an operating system error handler as it isolates subsystem errors. The method includes identifying subsystems in service less than a predefined time threshold by comparing a value stored in a power-on hours field in each subsystem to time thresholds, and including these modules in the tested subset.