Adaptive Dynamic Voltage Scaling Circuit for IC Power Optimization

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Solution Overview

Problem

Integrated circuit designs face challenges in controlling circuit parameters due to process variations, leading to unpredictable performance and increased power consumption, as they are conservative in setting margins to account for worst-case scenarios, resulting in larger dies and higher power usage.

Innovation Solution

An adaptive dynamic voltage scaling (DVS) circuit with process, temperature, and voltage-dependent test cells, each coupled with an internal variable voltage regulator, allows for real-time measurement of the minimum operational voltage and periodic adjustments to optimize power usage, reducing margins and die size while ensuring reliable operation.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If conservative margins are set to account for worst-case process variations, then reliability is improved, but power consumption increases and die size increases

Engineering Contradiction:
Improvecircuit performance reliabilityVSAvoidpower consumption
Core Design Contradiction:
ReliabilityVSUse of energy by moving object

Solution Approach 1:

The patent implements dynamic voltage scaling that adjusts operating voltage in real-time based on measured process variations and environmental conditions. Instead of using fixed conservative margins, the system dynamically optimizes voltage levels to maintain reliability while minimizing power consumption. The voltage regulator continuously adapts the supply voltage based on feedback from performance monitoring circuits.

Inventive Principle:
Principle #15Dynamics

Solution Approach 2:

The system changes the operating voltage parameter dynamically based on measured process variations, temperature, and workload conditions. By adjusting the voltage parameter in real-time rather than using a fixed conservative value, the system achieves both reliability and power efficiency. The voltage is scaled according to actual circuit performance needs rather than worst-case assumptions.

Inventive Principle:
Principle #35Parameter changes

2Reliability

If conservative margins are set to account for worst-case process variations, then reliability is improved, but die size increases

Engineering Contradiction:
Improvecircuit performance reliabilityVSAvoiddie size
Core Design Contradiction:
ReliabilityVSArea of stationary object

Solution Approach 1:

The patent uses dynamic voltage scaling to replace static conservative design margins with adaptive voltage adjustment. This eliminates the need for oversized circuit components and buffers designed for worst-case scenarios, as the system adapts to actual operating conditions. The die size is reduced by removing unnecessary margin-related circuitry while maintaining reliability through dynamic optimization.

Inventive Principle:
Principle #15Dynamics

Solution Approach 2:

The system changes operating voltage parameters dynamically based on measured conditions, eliminating the need for fixed conservative design margins that would increase die size. By adjusting voltage based on actual process variations and environmental conditions, the system achieves reliability without requiring larger transistors, wider interconnects, or additional buffer circuits.

Inventive Principle:
Principle #35Parameter changes

3Speed

If higher power supply voltage is used to compensate for process variations, then circuit speed is improved, but power consumption increases

Engineering Contradiction:
Improvecircuit propagation speedVSAvoidpower consumption
Core Design Contradiction:
SpeedVSUse of energy by moving object

Solution Approach 1:

The patent implements dynamic voltage scaling that adjusts the power supply voltage in real-time based on measured circuit performance and environmental conditions. The voltage is increased only when and where needed to achieve required propagation speeds, rather than applying a uniformly high voltage across the entire circuit. This dynamic adjustment minimizes power consumption while maintaining circuit speed requirements.

Inventive Principle:
Principle #15Dynamics

Solution Approach 2:

The system applies different voltage levels to different regions or circuits based on their specific performance requirements and measured process variations. Instead of using a single high voltage for the entire IC, the patent locally optimizes voltage levels for each circuit block or even individual gates, achieving required speeds only where necessary and reducing overall power consumption.

Inventive Principle:
Principle #3Local quality

4Speed

If lower threshold voltage transistors are used to achieve faster speeds, then circuit speed is improved, but current leakage increases

Engineering Contradiction:
Improvetransistor switching speedVSAvoidcurrent leakage
Core Design Contradiction:
SpeedVSObject-generated harmful factors

Solution Approach 1:

The patent uses dynamic voltage scaling to control the operating voltage of transistors with lower threshold voltages. By dynamically adjusting the supply voltage based on actual performance needs and environmental conditions, the system achieves fast switching speeds when required while minimizing leakage current during idle or low-performance periods. The voltage regulator adapts the power supply to match actual circuit demands rather than maintaining a constantly high voltage.

Inventive Principle:
Principle #15Dynamics

Data Source

PatentUS8884685B1Adaptive dynamic voltage scaling system and method
Publication Date: 2014.11.11 ENTROPIC COMM INC
  • US8884685B1 patent drawing
  • US8884685B1 patent drawing
  • US8884685B1 patent drawing

AI summary

Integrated circuit designs and methods using adaptive dynamic voltage scaling circuits for IC designs that compensate for some of the effects of PVT dependent characteristics on the fabrication of advanced IC's but allow lower margins and provide high die yields, smaller die size, and lower power usage. An inner control loop varies the voltage output of an internal variable voltage regulator powered by an IC circuit voltage, and monitors the operation of a test circuit until it reaches a cross-over point (i.e., either fails to operate or begins to operate) with respect to an essentially identical nearby reference circuit, at which point the IC circuit voltage is adjusted by an outer control circuit to that voltage output level plus a margin.