Adaptive ECC Correction in Memory Arrays for Lower Power

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Solution Overview

Problem

Existing memory devices face excessive power consumption due to Error Correction Code (ECC) being calibrated at a constant correction power throughout the life of the memory array, leading to inefficient power usage.

Innovation Solution

Adaptive ECC power management that adjusts correction power based on the number of detected errors, enabling selective activation of ECC circuit portions to optimize power consumption.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If ECC is calibrated at constant correction power throughout the life of the memory array, then reliability is maintained, but power consumption increases excessively

Engineering Contradiction:
Improveerror correction capabilityVSAvoidECC power consumption
Core Design Contradiction:
ReliabilityVSUse of energy by moving object

Solution Approach 1:

The ECC correction power is made dynamic rather than static. The system continuously monitors the number of errors in memory cells and adjusts the ECC correction power accordingly. When error rates are low, the correction power is reduced; when error rates increase, the correction power is increased to maintain reliability. This dynamic adaptation resolves the contradiction by allowing the system to maintain reliability only when necessary, thereby reducing excessive power consumption during periods when fewer corrections are needed.

Inventive Principle:
Principle #15Dynamics

Solution Approach 2:

The system changes the operational parameters of the ECC circuit based on the actual error conditions. By monitoring error rates and adjusting the correction power parameter, the system optimizes the balance between reliability and power consumption. This parameter change allows the ECC circuit to operate at lower power levels when high correction capability is not required, while still maintaining adequate reliability when errors increase.

Inventive Principle:
Principle #35Parameter changes

2Reliability

If maximum ECC correction power is used throughout the entire life of the array, then error correction reliability is ensured, but power consumption becomes inefficient

Engineering Contradiction:
Improvedata integrityVSAvoidexcessive power usage
Core Design Contradiction:
ReliabilityVSLoss of energy

Solution Approach 1:

Instead of always applying maximum ECC correction power (excessive action), the system applies only the necessary correction power based on actual error conditions (partial action). By monitoring the number of errors and adjusting the correction power accordingly, the system avoids the energy waste of using maximum correction capability when fewer corrections are needed, while still ensuring data integrity when errors occur.

Inventive Principle:
Principle #16Partial or excessive action

Solution Approach 2:

The system implements a feedback mechanism where the error rate is continuously monitored and used to adjust the ECC correction power. This closed-loop control ensures that the correction power is optimized based on actual conditions, preventing excessive power consumption while maintaining data integrity. The feedback from error monitoring directly influences the correction power level, creating an adaptive system that balances reliability and energy efficiency.

Inventive Principle:
Principle #23Feedback

Data Source

PatentUS12525311B2Methods and systems for reducing ECC power consumption
Publication Date: 2026.01.13 MICRON TECHNOLOGY INC
  • US12525311B2 patent drawing
  • US12525311B2 patent drawing
  • US12525311B2 patent drawing

AI summary

Operating an array of memory cells can include storing user data in memory cells of the memory array, storing parity data associated with the user data in a number of parity cells of the memory array, the parity data corresponding to selectable Error Correction Code (ECC) correction capabilities from a minimum ECC correction capability to a maximum ECC correction capability, calculating an ECC syndrome from the stored user data and parity data, based on the ECC syndrome, determining a number of errors in the data, and, based on the determined number of errors, selecting an ECC correction capability of the plurality of ECC correction capabilities. Related memory devices and systems are also herein disclosed.