Adaptive Workpiece Edge Machining via Independent Side and Top Scanning
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Solution Overview
Problem
Legacy inspection and positioning methods are inadequate for achieving the necessary accuracy in tool machining applications for consumer electronic devices, particularly due to the increasing complexity and miniaturization of components, which requires precise alignment and machining of small features.
Innovation Solution
A method and system that utilize a support fixture with alignment features to secure the workpiece in a stationary position, employing side and top scanning systems to obtain precise edge profile data, which is then used to determine a customized tool path for machining the cover material to match the workpiece edge, ensuring accurate alignment and machining.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Manufacturing precision
If legacy inspection and positioning methods are used, then the manufacturing process is simple, but the manufacturing precision is insufficient for tight tolerances
Solution Approach 1:
The inspection system is segmented into two independent scanning systems: a top scanning system for acquiring workpiece top surface data and a side scanning system for acquiring workpiece side surface data. This segmentation allows each system to specialize in specific measurement tasks, achieving high precision without requiring a single complex inspection system to handle all measurement requirements.
Solution Approach 2:
Alignment features are introduced as intermediary elements that serve as common reference points between the top scanning system and side scanning system. These features enable coordinate transformation and data correlation between the two independent scanning systems, allowing precise alignment without direct complex interaction between the scanning systems themselves.
2Measurement precision
If traditional top-only scanning is used, then the inspection system is simple, but the measurement precision of edge profiles is insufficient
Solution Approach 1:
The measurement approach transitions from two-dimensional top-down scanning to three-dimensional measurement by incorporating side scanning. The side scanning system captures edge profile data from a lateral perspective, adding depth information and enabling precise measurement of vertical edges and surface contours that cannot be accurately measured from the top view alone.
Solution Approach 2:
Different scanning methods are applied to different regions of the workpiece: the top scanning system measures the top surface and alignment features, while the side scanning system specifically measures the side surfaces and edges. This localized application of specialized scanning methods optimizes measurement precision for each region's specific geometric characteristics.
3Manufacturing precision
If multiple scanning systems are employed, then the measurement precision improves, but the device complexity increases
Solution Approach 1:
The alignment features serve multiple functions: they are scanned by both the top scanning system and side scanning system, providing common reference points for coordinate transformation, workpiece positioning, and data correlation. This multi-functionality reduces the need for separate reference systems for each scanning system, simplifying the overall system integration.
Solution Approach 2:
The patent replaces complex mechanical alignment and positioning mechanisms with optical scanning and computational coordinate transformation. Instead of using精密 mechanical fixtures to physically align multiple scanning systems, the system uses alignment features and mathematical transformations to achieve precise coordination between scanners, reducing mechanical complexity.
Data Source
AI summary
Alignment features (60) associated with a support fixture (36) provide side scan data and top scan data reference points. Side scan displacement sensors (112) obtain side scan data of workpiece edge segments (23), and one or more cameras (130) obtain top scan data to provide a machining reference for the side scan data. The side scan data can be transformed into a top-view coordinate system usable by the laser machining system (140).