Adaptive Irradiation Pattern for Distance Measurement Accuracy
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Solution Overview
Problem
Conventional distance measurement methods face challenges in accurately measuring distances to objects with varying reflectance materials or colors, leading to saturation or insufficient light intensity issues, which can result in failed pattern detection and inaccurate measurements.
Innovation Solution
An information processing apparatus that generates a measurement pattern with varying irradiation light intensities based on regions, allowing for simultaneous accurate distance measurement of multiple portions by adjusting the irradiation light distribution according to the reflectance characteristics of the target objects.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If uniform irradiation light intensity is used for the entire measurement target, then the device complexity is reduced and operation is simplified, but measurement precision deteriorates due to saturation of high-reflectance regions and insufficient light in low-reflectance regions
Solution Approach 1:
The patent applies local quality by dividing the measurement target into multiple regions (first region with high reflectance, second region with low reflectance) and assigning different irradiation light intensities to each region. The irradiation pattern generation unit creates a measurement pattern where the first region receives reduced irradiation light intensity to prevent saturation, while the second region receives increased irradiation light intensity to ensure sufficient contrast, thereby achieving accurate distance measurement for each region according to its specific reflectance characteristics
Solution Approach 2:
The patent changes the parameter of irradiation light intensity based on the reflectance characteristics of different regions. The irradiation pattern generation unit adjusts the irradiation light intensity parameter dynamically - reducing it for high-reflectance regions and increasing it for low-reflectance regions - to optimize the captured image quality and enable accurate distance measurement across diverse surface materials
2Measurement precision
If high irradiation light intensity is used to ensure sufficient light for low-reflectance regions, then measurement precision for low-reflectance regions is improved, but harmful effects occur due to light saturation in high-reflectance regions
Solution Approach 1:
The patent applies local quality by spatially differentiating the irradiation light intensity across the measurement target. The irradiation pattern generation unit creates a non-uniform measurement pattern where high-reflectance regions (first region) are irradiated with reduced light intensity to prevent saturation, while low-reflectance regions (second region) are irradiated with increased light intensity to ensure sufficient contrast, thereby eliminating the harmful saturation effect while maintaining measurement accuracy
Solution Approach 2:
The patent converts the harmful effect of varying reflectance (which causes saturation or insufficient light) into a benefit by using the detected reflectance characteristics to dynamically adjust the irradiation pattern. The system detects regions with different reflectance properties and adapts the irradiation light intensity accordingly, turning the challenge of material diversity into an opportunity for optimized measurement
3Object-generated harmful factors
If low irradiation light intensity is used to prevent saturation in high-reflectance regions, then harmful effects are reduced, but measurement precision deteriorates due to insufficient light intensity in low-reflectance regions
Solution Approach 1:
The patent applies local quality by assigning different irradiation light intensities to different regions based on their reflectance characteristics. The irradiation pattern generation unit ensures that low-reflectance regions (second region) receive increased irradiation light intensity to compensate for their low reflectivity, while high-reflectance regions (first region) receive reduced intensity to prevent saturation, thereby maintaining adequate light levels for accurate measurement in all regions
Solution Approach 2:
The patent changes the irradiation light intensity parameter dynamically based on region-specific reflectance detection. The system adjusts the intensity parameter upward for low-reflectance regions to ensure sufficient light reaches the imaging unit, while reducing it for high-reflectance regions, thereby optimizing the light conditions for distance measurement across the entire measurement target
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables precise and simultaneous distance measurement of high-reflectance and low-reflectance materials, as well as objects at different distances, by optimizing irradiation light intensities, thereby improving the accuracy of robotic assembly tasks.
Implementation Method 1
a first region and a second region from a captured image obtained by the imaging unit, the first region including a first portion of a measurement target that reflects a greater amount of light toward the imaging unit
Data Source
AI summary
An information processing apparatus includes an irradiation unit to irradiate a measurement target with a measurement pattern for distance measurement. An imaging unit obtains a captured image including the irradiated measurement target. A first detection unit detects first and second regions from the captured image. The first region includes a first portion of the measurement target that reflects a greater amount of light toward the imaging unit. The second region includes a second portion of the measurement target that reflects a lesser amount of light toward the imaging unit. A second detection unit detects, from the measurement pattern, a first region with which the first portion is irradiated and a second region with which the second portion is irradiated. A generation unit generates a measurement pattern that has different amounts of irradiation light depending on regions. A distance to the measurement target is derived using an obtained captured image.