Adaptive LDPC Decoder Parameters for 3D Flash Memory Zones

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Solution Overview

Problem

High-capacity data storage devices, such as 3D flash memory and multi-level cell (MLC) devices, are prone to errors due to dense threshold voltage distributions and cell-to-cell interference, which existing error correction codes struggle to address effectively, especially as operating conditions and physical locations within the memory device change.

Innovation Solution

The implementation of a self-adaptive low-density parity check (LDPC) decoder that adjusts its parameters based on operating conditions and physical locations within the memory device, using prior successful decoder parameters and a set of predefined parameters to optimize decoding performance.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Quantity of substance

If traditional error correction codes are used for high-capacity data storage devices, then data storage capacity is increased, but error correction capability deteriorates due to dense threshold voltage distributions and cell-to-cell interference

Engineering Contradiction:
Improvedata storage capacityVSAvoiderror correction capability
Core Design Contradiction:
Quantity of substanceVSReliability

Solution Approach 1:

The patent dynamically changes decoder parameters (such as threshold values, iteration counts, and syndrome calculation parameters) based on detected error patterns and operating conditions. This allows the LDPC decoder to adapt to varying error characteristics caused by dense threshold voltage distributions and cell-to-cell interference, maintaining high error correction capability while supporting high storage capacity

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The patent implements a dynamic parameter adjustment mechanism where decoder parameters are not fixed but are continuously adapted based on real-time feedback from decoding performance and error patterns. This dynamic adaptation enables the system to handle the increased error rates associated with high-capacity storage while maintaining efficient decoding operation

Inventive Principle:
Principle #15Dynamics

2Reliability

If decoder parameters are optimized for each physical location zone, then decoding reliability is improved, but device complexity increases due to need for multiple parameter sets

Engineering Contradiction:
Improvedecoding reliabilityVSAvoidparameter management complexity
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The patent divides the memory device into multiple physical location zones (e.g., upper, middle, lower zones) and assigns different decoder parameter sets to each zone based on their specific error characteristics. This localized parameter optimization improves decoding reliability for each zone while managing complexity through systematic zone-based classification rather than individual parameter optimization for each memory cell

Inventive Principle:
Principle #3Local quality

Solution Approach 2:

The patent segments the memory device into distinct physical location zones and creates separate parameter optimization strategies for each segment. This segmentation approach reduces overall system complexity by grouping memory locations with similar error characteristics together, allowing for manageable parameter sets rather than requiring unique parameters for every memory cell

Inventive Principle:
Principle #1Segmentation

3Reliability

If large look-up tables are used to store optimal decoder parameters, then decoding performance is improved, but memory resource consumption increases

Engineering Contradiction:
Improvedecoding performanceVSAvoidmemory resource consumption
Core Design Contradiction:
ReliabilityVSQuantity of substance

Solution Approach 1:

Instead of storing large look-up tables with pre-computed optimal parameters for all possible conditions, the patent implements a dynamic parameter generation mechanism that computes appropriate decoder parameters on-demand based on current error patterns and operating conditions. This approach maintains high decoding performance while significantly reducing memory resource consumption by eliminating the need for extensive pre-stored parameter tables

Inventive Principle:
Principle #35Parameter changes

Data Source

PatentUS11444637B2Self-adaptive low-density parity check hard decoder
Publication Date: 2022.09.13 SK HYNIX INC
  • US11444637B2 patent drawing
  • US11444637B2 patent drawing
  • US11444637B2 patent drawing

AI summary

Disclosed are methods, systems and devices for decoding data read from a memory device, including receiving noisy data from a first memory location included in a word line zone of the memory device, identifying the word line zone and a prior successful decoder parameter associated with the word line zone, decoding the noisy data using the prior successful decoder parameter used in a prior successful decoding with respect to a second memory location included in the same word line zone, determining whether the decoding based on the prior successful decoder parameter has succeeded, maintaining, upon a determination that the decoding has succeeded, the prior successful decoder parameter as a decoder parameter for the first memory location, and decoding, upon a determination that the decoding operation has failed, the noisy data read from the first memory location by using another decoder parameter selected from a set of predefined decoder parameters.