Adaptive Memory Scan Frequency Control
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Solution Overview
Problem
Current memory subsystems utilize a fixed data integrity scan frequency based on worst-case scenarios, leading to unnecessarily high scan rates, which delay memory access and reduce bandwidth, despite varying memory age, endurance, and utilization levels.
Innovation Solution
Implementing an adaptive data integrity scan frequency that dynamically adjusts based on the age and utilization of memory devices, reducing scan frequency during the beginning and middle of a memory device's life and when not fully utilized, thereby optimizing scan intervals without compromising data reliability.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If a fixed data integrity scan frequency based on worst-case scenarios is used, then data reliability is maintained, but memory access bandwidth is reduced and scan delays increase
Solution Approach 1:
The patent implements dynamic scan frequency adjustment based on memory device characteristics. The controller determines age indicators and endurance indicators for each memory device and adjusts the scan frequency accordingly, transitioning from a static worst-case approach to a dynamic adaptive approach that optimizes both reliability and performance
Solution Approach 2:
The patent changes the scan frequency parameter based on determined characteristics of memory devices. By calculating age indicators (based on manufacturing dates) and endurance indicators (based on program/erase cycle counts), the system adjusts scan frequency to match actual device conditions rather than using a fixed conservative parameter
2Reliability
If a fixed high scan frequency is used to ensure data integrity, then data reliability is maintained, but scan delays increase and access performance deteriorates
Solution Approach 1:
The system dynamically adjusts scan frequency based on real-time characteristics of memory devices. By determining age indicators and endurance indicators, the controller adapts scan intervals to match actual device reliability needs, reducing unnecessary scans for younger, more reliable devices while maintaining high scan frequencies for older or degraded devices
Solution Approach 2:
The scan frequency parameter is changed based on determined device characteristics. The controller calculates appropriate scan intervals by considering age indicators (time since manufacturing) and endurance indicators (program/erase cycle counts), adjusting the time parameter to optimize between data integrity and access performance
Data Source
AI summary
Exemplary methods, apparatuses, and systems include detecting a trigger to update a data integrity scan frequency. In response to detecting the trigger, an age indicator for a subdivision of memory or a utilization value for the subdivision of memory are obtained. A new data integrity scan frequency is determined using the age indicator or the utilization value. A scan of the subdivision of memory is initiated during a current media scan loop using the new data integrity scan frequency.