Adaptive Memory Storage Mode Based on Wear Degree
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Solution Overview
Problem
The existing methods for manufacturing memory storage devices require extensive testing of rewritable non-volatile memory modules, which can lead to a decrease in their lifespan due to repeated programming and erasure, and do not ensure data correctness, especially when the wear degree value exceeds a certain threshold.
Innovation Solution
A data storing method and memory controlling circuit unit that determine the wear degree value of the rewritable non-volatile memory module and store data using either a first mode for higher reliability when the wear degree value is below a threshold or a second mode when it is not, allowing direct use of the memory module without extensive testing.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If extensive testing of rewritable non-volatile memory modules is performed to ensure data correctness, then data reliability is improved, but the lifespan of the memory module decreases due to repeated programming and erasure
Solution Approach 1:
The patent changes the parameter of data storage mode based on the wear degree value. When the wear degree is below a threshold, a first storage mode with higher data correctness is used; when the wear degree exceeds the threshold, a second storage mode is used. This dynamic parameter adjustment resolves the contradiction by adapting the storage mode to the current wear state, ensuring data correctness while preventing excessive wear from extensive testing.
2Reliability
If repeated programming and erasure are performed during manufacturing testing, then data correctness is verified, but the wear degree value increases reducing memory lifespan
Solution Approach 1:
The patent performs a preliminary determination of the wear degree value before storing data. Based on this preliminary assessment, the system selects an appropriate storage mode that prevents excessive wear accumulation. This preliminary action avoids the need for extensive repeated programming and erasure testing, thereby preserving memory lifespan while still ensuring data correctness through adaptive mode selection.
3Reliability
If data is stored using a mode with higher reliability, then data correctness is improved, but the wear degree increases faster
Solution Approach 1:
The patent implements a dynamic storage mode selection mechanism that adapts to the current wear degree value. The system transitions between first and second storage modes based on real-time wear assessment. This dynamic approach resolves the contradiction by using high-reliability modes only when necessary (below threshold) and switching to lower-wear modes when the wear degree increases, thereby extending the time until the wear threshold is reached while maintaining data reliability.
Data Source
AI summary
A data storing method, a memory controlling circuit unit and a memory storage device are provided. The method includes: receiving a first data; determining whether a wear degree value of a rewritable non-volatile memory module is less than a threshold; if the wear degree value of the rewritable non-volatile memory module is less than the threshold, storing the first data into the rewritable non-volatile memory module by using a first mode; and if the wear degree value of the rewritable non-volatile memory module is not less than the threshold, storing the first data into the rewritable non-volatile memory module by using a second mode. A reliability of the first data stored by using the first mode is higher than a reliability of the first data stored by using the second mode.