Adaptive Skin Image Capture for Lesion Visibility
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Automated skin inspection systems face challenges in capturing high-quality images that clearly reveal potential abnormalities due to fixed, predefined image acquisition parameters, which often compromise visibility of specific features like small lesions or subtle textures, and lack the ability to intelligently adjust settings based on the content of the image.
Innovation Solution
A method and system for adaptive image acquisition that analyzes an initial image to identify features of interest and dynamically adjusts settings, such as illumination intensity and exposure time, to capture a second optimized image, allowing for enhanced visibility of specific features.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If fixed, predefined image acquisition parameters are used, then the system operates simply and quickly, but the visibility of specific features like small lesions or subtle textures is compromised
Solution Approach 1:
The patent implements dynamic adjustment of image acquisition parameters (illumination intensity, exposure time, contrast) based on real-time analysis of captured images. The system transitions from static, fixed parameters to dynamic, adaptive parameters that change according to the specific features detected in the skin inspection area, thereby improving visibility without requiring permanent system complexity
Solution Approach 2:
The system employs a feedback mechanism where the first captured image is analyzed to identify features of interest, and this analysis feeds back into adjusting the acquisition parameters for subsequent images. The processor uses the information from the initial image to optimize settings for capturing detailed views of specific features, creating a closed-loop control system that improves measurement precision
2Measurement precision
If parameters are adjusted to reveal dark or low-contrast features, then visibility of lesions improves, but the rest of the image becomes overexposed and washes out other details
Solution Approach 1:
The patent applies local quality by adjusting image acquisition parameters specifically for regions containing features of interest while maintaining different parameters for other areas. The system identifies dark or low-contrast features and optimizes illumination and exposure locally for those regions, preventing overexposure in other areas and preserving information across the entire image
Solution Approach 2:
The system dynamically adjusts parameters between capturing the first image and subsequent detailed images. After identifying features of interest in the initial capture, the processor modifies illumination intensity and exposure time specifically for re-capturing those areas, allowing optimal visibility of dark features without compromising other regions
3Productivity
If a single image is captured with general settings, then the overall inspection area is covered, but the opportunity to obtain optimized views of specific problem areas is lost
Solution Approach 1:
The patent segments the inspection process into two distinct phases: first, capturing an overview image of the entire inspection area with general settings to maintain productivity and coverage; second, identifying features of interest and capturing detailed images of specific problem areas with optimized parameters. This segmentation allows the system to achieve both broad coverage and detailed inspection
Solution Approach 2:
The system performs a preliminary action by capturing the first image with general settings to identify features of interest before optimizing parameters for detailed capture. This preliminary overview shot guides subsequent targeted imaging, ensuring that productivity is maintained while setting up for enhanced measurement precision in the second phase
Data Source
AI summary
A method for operating a skin inspection device is disclosed. The method provides for an adaptive image acquisition process to improve the visibility of detected features. The method comprises capturing a first image of an inspection area and analyzing the first image with a processor to identify a feature of interest. Based on one or more characteristics of the identified feature, the processor determines a set of adjusted image acquisition parameters. A second, feature inspection image is then captured of at least a portion of the inspection area using these adjusted parameters. The adjusted image acquisition parameters are specifically configured to optimize the visibility of the identified feature of interest in the second image, thereby enabling a more detailed and accurate analysis.