3D Image Reconstruction via Adaptive Tilt Angle Selection
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Solution Overview
Problem
Current methods for reconstructing three-dimensional images from two-dimensional electron microscope images are limited by angular restrictions, leading to missing information and false images, especially when objects have multiple components or unknown structural compositions.
Innovation Solution
A method involving an electron microscope system that tilts the object at predetermined angles, aligns and projects images, calculates errors, determines processing priority based on errors and densities, and adjusts pixel gray levels to optimize image reconstruction, allowing for more precise three-dimensional imaging with reduced false and missing parts.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If the tilt angle range is extended to ±90° to improve reconstruction precision, then measurement precision is improved, but device complexity increases due to sample holder structure blocking electron beams
Solution Approach 1:
The patent divides the reconstruction process into multiple stages: initial reconstruction from limited tilt angles, identification of missing information regions, and iterative refinement by acquiring additional images at specific angles. This segmentation allows reconstruction to proceed in steps rather than requiring all data upfront, resolving the contradiction between limited tilt range and reconstruction precision.
Solution Approach 2:
The patent performs preliminary reconstruction using available tilt angle data before acquiring additional images. The initial reconstructed image guides the selection of subsequent tilt angles needed to fill missing information, allowing the system to progressively improve precision without requiring all data to be available beforehand.
2Measurement precision
If the tilt angle increment is reduced to improve reconstruction precision, then measurement precision is improved, but loss of time increases due to the need for more images
Solution Approach 1:
The patent applies partial action by acquiring tilt images only at strategically selected angles rather than continuously. The system identifies specific angle ranges where additional images are most beneficial for filling missing information, avoiding the time cost of acquiring all possible tilt images while still achieving high precision reconstruction.
Solution Approach 2:
The patent uses feedback from the initial reconstruction to guide subsequent image acquisition. The reconstructed image identifies regions with missing information, and this feedback determines which additional tilt angles should be acquired next, creating an efficient adaptive process that minimizes acquisition time while maximizing precision.
3Measurement precision
If algebraic reconstruction techniques are used to improve reconstruction precision, then measurement precision is improved, but device complexity increases due to computational requirements
Solution Approach 1:
The patent segments the computational process into distinct modules: initial reconstruction algorithm, error analysis module, missing information detection, and iterative refinement. This modular approach makes the complex computational process more manageable and allows each module to be optimized independently, reducing overall system complexity while maintaining high precision.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach enables highly precise three-dimensional reconstruction with reduced false and missing parts, improving image quality and applicability to complex objects with unknown structural compositions.
Implementation Method 1
an irradiation device for irradiating an object to be observed with electron beams or X-rays; a detector for detecting responses of the object occurring as a result of irradiation thereof
Data Source
AI summary
Disclosed is image processing: that significantly reduces false images and missing images in reconstructed images, improves reconstruction accuracy; and that can be applied to objects to be observed that are composed of a plurality of components, and to samples having an unknown number of structural compositions. An image processing device is provided with: a means, in an electron microscope having an imaging device and a tilting device that tilts an object to be observed, for tilting said object to be observed in an angle step, and storing the obtained tiled image; a means for aligning the position of said tilted images; a means for generating an initial reconstructed image based on said tilted images; a means for projecting said initial reconstructed image at arbitrarily-defined angles and generating a plurality of projected images; a means for calculating errors in the corresponding pixels between the tilted images and the projection images; a means for determining a processing priority from said errors; a means for calculating the density for each gradation level; a means for determining the processing priority from said densities; and a means for changing the density value of each pixel in the initial reconstructed image in each of the above-mentioned priorities.