Semiconductor Data Output Circuit With Adaptive Timing Margin Control

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Solution Overview

Problem

Conventional semiconductor data output circuits face challenges in maintaining a stable timing margin between data and control signals due to variations in process, voltage, and temperature (PVT) and physical/electrical factors, making it difficult to select an appropriate margin for stable operation without deteriorating asynchronous parameters like address access time.

Innovation Solution

A data output circuit with a pattern data generation unit, variable delay unit, and delay time control block that automatically adjusts the timing margin by generating pattern data and control signals to compare phases, allowing for dynamic adjustment of delay times based on margin adjustment signals.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If a large timing margin is set for stable operation, then operation stability is improved, but address access time deteriorates

Engineering Contradiction:
Improveoperation stabilityVSAvoidaddress access time
Core Design Contradiction:
ReliabilityVSLoss of time

Solution Approach 1:

The patent implements a variable delay unit that dynamically adjusts the delay time of the source signal based on detected phase differences between GIO data and source signals. This dynamic adjustment allows the timing margin to be optimized for stability while minimizing the address access time penalty, resolving the contradiction between reliability and time loss.

Inventive Principle:
Principle #15Dynamics

Solution Approach 2:

The patent employs a delay time control block that detects the phase relationship between GIO data and source signals, then feeds back control signals to adjust the variable delay unit. This feedback mechanism automatically optimizes the timing margin to ensure stable operation while minimizing the impact on address access time characteristics.

Inventive Principle:
Principle #23Feedback

2Loss of time

If a small timing margin is set to improve address access time, then address access time is improved, but operation failure may occur

Engineering Contradiction:
Improveaddress access timeVSAvoidoperation stability
Core Design Contradiction:
Loss of timeVSReliability

Solution Approach 1:

The variable delay unit provides dynamic adjustment capability, allowing the system to maintain the smallest possible timing margin that still ensures stable operation. This eliminates the need to use excessively large margins and thereby improves address access time while preventing operation failures.

Inventive Principle:
Principle #15Dynamics

Solution Approach 2:

The phase detection and feedback control mechanism continuously monitors the timing relationship between GIO data and source signals, automatically adjusting the delay to maintain adequate timing margins. This prevents operation failures while minimizing the timing margin to improve address access time.

Inventive Principle:
Principle #23Feedback

3Device complexity

If fixed delay units are used to simplify circuit design, then device complexity is reduced, but timing margin variation under PVT conditions increases

Engineering Contradiction:
Improvecircuit complexityVSAvoidtiming margin stability
Core Design Contradiction:
Device complexityVSReliability

Solution Approach 1:

The patent introduces a feedback control mechanism where the delay time control block detects phase differences and adjusts the variable delay unit accordingly. This feedback system compensates for PVT variations automatically, maintaining timing margin stability without requiring overly complex fixed delay circuits.

Inventive Principle:
Principle #23Feedback

Solution Approach 2:

The variable delay unit allows the delay time parameter to be dynamically changed based on detected phase relationships and PVT conditions. This parameter adjustability compensates for environmental variations while keeping the overall circuit design relatively simple compared to complex fixed delay networks.

Inventive Principle:
Principle #35Parameter changes

Data Source

PatentUS20140043926A1Data output circuit of semiconductor device
Publication Date: 2014.02.13 SK HYNIX INC
  • US20140043926A1 patent drawing
  • US20140043926A1 patent drawing
  • US20140043926A1 patent drawing

AI summary

A data output circuit of a semiconductor device includes: a pattern data generation unit configured to generate pattern data in response to a bank selection signal, a variable delay unit configured to delay a source signal, which is generated in response to the bank selection signal, by a delay time corresponding to a delay control signal, a pattern control signal generation unit configured to generate a pattern control signal in response to an output signal of the variable delay unit, and a delay time control block configured to generate the delay control signal in response to the phases of the pattern control signal and the pattern data.