Adaptive X-Ray Spectral Acquisition for Mineral Classification

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Solution Overview

Problem

Existing material analysis methods, particularly in mineralogy classification, face challenges in efficiently distinguishing chemically similar minerals due to overlapping X-ray spectra and require lengthy acquisition times, leading to inefficiencies and potential errors in statistical reporting.

Innovation Solution

A system and method utilizing a scanning microscope with dual detectors for backscattered electrons and X-rays, combined with data-processing to segment images, calculate confidence scores, and adjust X-ray acquisition times based on spectral quality, enabling selective and efficient mineral identification.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If X-ray acquisition is performed at all scan locations to obtain compositional information, then measurement precision is improved, but loss of time increases significantly

Engineering Contradiction:
Improvecompositional information accuracyVSAvoidacquisition time
Core Design Contradiction:
Measurement precisionVSLoss of time

Solution Approach 1:

The patent segments the scan locations into different groups based on BSE intensity characteristics. High-confidence regions (homogeneous areas) are processed with quick BSE-only classification, while low-confidence regions (heterogeneous areas with chemically similar minerals) are processed with full X-ray spectroscopy. This segmentation allows the system to apply different acquisition strategies to different parts of the sample, reducing overall acquisition time while maintaining precision where needed.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent applies different quality levels of analysis to different regions: rapid BSE-based classification is applied to regions where it suffices (homogeneous areas), while full X-ray spectral analysis is applied locally only to regions where chemically similar minerals are present. This local quality approach ensures high measurement precision is maintained at scan locations where it matters most, while avoiding unnecessary time consumption in regions where simpler methods suffice.

Inventive Principle:
Principle #3Local quality

2Measurement precision

If X-ray acquisition time is increased to resolve overlapping spectra of chemically similar minerals, then measurement precision is improved, but productivity decreases

Engineering Contradiction:
Improvemineral classification accuracyVSAvoidthroughput
Core Design Contradiction:
Measurement precisionVSProductivity

Solution Approach 1:

The patent implements a dynamic, adaptive acquisition strategy where the system first performs rapid BSE-based classification to identify regions with chemically similar minerals (low confidence regions). Only in these specific regions does the system dynamically increase X-ray acquisition time to resolve overlapping spectra. In all other regions, standard or reduced acquisition times are used. This dynamic adjustment of acquisition parameters based on real-time analysis maintains high measurement precision where needed while preserving overall productivity.

Inventive Principle:
Principle #15Dynamics

Solution Approach 2:

The patent performs preliminary BSE image acquisition and analysis before conducting X-ray spectroscopy. This preliminary action identifies which scan locations require full spectral analysis by detecting regions with heterogeneous mineral compositions or chemically similar minerals. By performing this preliminary screening, the system avoids unnecessary long acquisition times at locations where simple BSE classification suffices, thus maintaining productivity while ensuring measurement precision is applied selectively where it is truly needed.

Inventive Principle:
Principle #10Preliminary action

3Reliability

If full spectral analysis is performed at all locations, then reliability is improved, but loss of time increases

Engineering Contradiction:
Improveclassification reliabilityVSAvoidanalysis time
Core Design Contradiction:
ReliabilityVSLoss of time

Solution Approach 1:

The patent implements a feedback mechanism where the initial BSE-based classification results are used to identify low-confidence regions. The system then applies full X-ray spectral analysis specifically to these identified regions, using the feedback from the first analysis stage to guide the second, more time-consuming analysis stage. This feedback-driven approach ensures reliability is improved only where the initial analysis indicates uncertainty, rather than uniformly across all scan locations, thus reducing overall time loss while maintaining classification reliability where it matters.

Inventive Principle:
Principle #23Feedback

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Enhances mineral classification accuracy by dynamically adjusting X-ray acquisition times, improving spectral resolution, and reducing acquisition time for chemically similar minerals, thus increasing throughput and reducing errors in material analysis.

Implementation Method 1

Backscattered electrons (BSE) originate from the primary electron beam, which, as the name suggests, are reflected back (i.e., out of the sample) via elastic scattering on the sample atoms.

Methodology Applied
Scientific EffectElastic scattering: Scattering

Implementation Method 2

Along with the emissions of backscattered electrons, emissions of X-rays can also emerge from the interaction of the primary beam with the sample. In particular, characteristic X-rays are emitted when primary electrons cause the ejection of an electron in an inner shell of a sample atom, creating an electron hole. This electron hole is then filled by another electron from an outer atomic shell through the emission of an X-ray photon.

Methodology Applied
Scientific EffectCharacteristic X-ray emission: X-Ray

Data Source

PatentUS12417645B2Multiple image segmentation and/or multiple dynamic spectral acquisition for material and mineral classification
Publication Date: 2025.09.16 FEI CO
  • US12417645B2 patent drawing
  • US12417645B2 patent drawing
  • US12417645B2 patent drawing

AI summary

The invention relates to method and system configured for material analysis and mineralogy. At least one image based on first emission from a sample is provided. First spectra of the sample based on second emissions from the second scan locations of the image are provided. A confidence score is calculated for every first spectrum, and second scan location(s) with confidence score(s) below a threshold value are selected. Second emissions from the selected second scan location(s) are acquired to provide new image and determine new second scan locations within the respective new image.