ADAS Sensor Test Interface for Processing-Chain Fault Isolation
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Solution Overview
Problem
Advanced driver assistance systems (ADAS) lack specific test interfaces that optimize and improve test-bench runs, making it difficult to detect failures and mechanical alignment errors in complex ADAS systems.
Innovation Solution
An object sensor test system with a test bench and a test interface that selectively injects and extracts test data within the processing chain of ADAS sensors, allowing for comparison with expected data to determine normal or abnormal operation of processing segments.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If general test interfaces are used for ADAS sensors, then basic testing functionality is provided, but testing precision and failure detection capability are insufficient
Solution Approach 1:
The test interface is segmented into multiple independent injection points corresponding to different processing components (signal acquisition, preprocessing, object detection, tracking). This allows targeted testing of specific segments without requiring complete system complexity, improving measurement precision for failure detection while managing overall complexity through modular segmentation.
Solution Approach 2:
The patent introduces an intermediary test interface that mediates between the test bench and the processing chain. This intermediary structure provides standardized access points for injecting test data at various processing stages, enhancing detection precision without directly increasing the complexity of the core processing components.
2Reliability
If comprehensive testing of all processing components is performed, then complete system reliability is assessed, but testing time and resource consumption increase
Solution Approach 1:
The test interface enables preliminary action by allowing test data to be injected at specific processing stages before complete system operation. This permits isolated testing of individual components (e.g., signal acquisition or object detection) to assess their reliability independently, reducing the need for time-consuming comprehensive system-wide testing while maintaining overall reliability assessment.
Solution Approach 2:
The patent applies partial action by enabling selective testing of only the necessary processing components based on suspected failure modes or specific testing objectives. Rather than requiring complete testing of all processing stages, the interface allows targeted injection at relevant points, reducing testing time while maintaining sufficient reliability verification for critical components.
3Difficulty of detecting and measuring
If test data is injected at multiple points in the processing chain, then component-level failure detection is improved, but system complexity and data management burden increase
Solution Approach 1:
The processing chain is segmented into distinct functional blocks (signal acquisition, preprocessing, object detection, tracking), each with dedicated test data injection points. This segmentation allows component-level failure detection by isolating test injection to specific segments, improving detection capability while managing complexity through structured modular organization of test points.
Solution Approach 2:
The test interface provides universal multi-functional access points that can handle different types of test data injection across multiple processing stages through a unified interface structure. This universality enables component-level failure detection at various points without proportionally increasing system complexity, as the same interface architecture serves multiple testing functions.
Data Source
AI summary
An object sensor test system includes a sensor and a test bench. The sensor includes a receiver configured to receive a simulated optical signal and a processing chain that includes a plurality of processing components configured to process at least one measurement signal generated in response to the simulated optical signal to generate processed test data. The sensor also includes a test interface configured to receive a control signal, and selectively extract processed test data at a selected output of the processing chain based on the control signal. The test bench is configured to transmit the control signal to the test interface, receive the processed test data from the sensor, compare the received processed test data with expected data to generate a comparison result, and determine that a segment of the processing chain is operating normally or abnormally based on the comparison result.