ADC Calibration with Stored Error Data for Accurate Digital Codes

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Solution Overview

Problem

Analog-to-digital converters in semiconductor integrated circuits face errors due to manufacturing process characteristics, leading to inaccuracies in digital signal conversion, and existing calibration methods require additional hardware or design changes, increasing design overhead and cost.

Innovation Solution

A method to calibrate analog-to-digital converters by measuring and storing gain and offset errors during manufacturing, using existing hardware configurations, allowing for accurate digital code generation without additional design changes.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Manufacturing precision

If calibration methods are implemented to reduce errors in digital code generation, then manufacturing precision is improved, but device complexity increases due to additional hardware requirements

Engineering Contradiction:
Improveaccuracy of digital code generationVSAvoidhardware configuration complexity
Core Design Contradiction:
Manufacturing precisionVSDevice complexity

Solution Approach 1:

The ADC performs self-calibration by measuring its own gain and offset errors through internal test modes and automatically applying correction factors to calibrated digital codes, eliminating the need for external calibration hardware or manual adjustment mechanisms

Inventive Principle:
Principle #25Self-service

Solution Approach 2:

Gain and offset errors are measured and correction factors are calculated in advance during manufacturing testing, and the results are stored in non-volatile memory for later use during normal operation, preventing errors before they affect production output

Inventive Principle:
Principle #10Preliminary action

2Manufacturing precision

If additional hardware is added for calibration purposes, then manufacturing precision is improved, but ease of manufacture deteriorates due to increased design overhead and cost

Engineering Contradiction:
Improveerror calibration accuracyVSAvoiddesign overhead and manufacturing cost
Core Design Contradiction:
Manufacturing precisionVSEase of manufacture

Solution Approach 1:

Existing ADC hardware components are designed to perform multiple functions: normal signal conversion during operation and self-calibration during test modes, eliminating the need for separate dedicated calibration hardware and reducing overall device complexity

Inventive Principle:
Principle #6Universality (Multi-functionality)

Solution Approach 2:

The calibration system uses the ADC's own existing infrastructure (signal paths, digital processing units, and memory) to perform self-diagnosis and self-correction, rather than requiring external calibration equipment or additional specialized components

Inventive Principle:
Principle #25Self-service

Data Source

PatentUS11705915B2Method of operating analog-to-digital converter and analog-to-digital converter performing the same
Publication Date: 2023.07.18 SAMSUNG ELECTRONICS CO LTD
  • US11705915B2 patent drawing
  • US11705915B2 patent drawing
  • US11705915B2 patent drawing

AI summary

In a method of operating an analog-to-digital converter, a gain error and an offset error that are associated with a digital code generated from the analog-to-digital converter are obtained by performing a first analog-to-digital conversion on a first input analog signal. The gain error and the offset error are stored. A calibration digital code is generated by performing a second analog-to-digital conversion on a second input analog signal based on the gain error and the offset error.