Time-Interleaved ADC Clock Skew Calibration for High SNR

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Solution Overview

Problem

Timing mismatches in clock signals in ADCs limit the signal-to-noise ratio of the ADCs, especially in high-speed applications, where clock skew detection is affected by NOx and SO2.

Innovation Solution

The proposed calibration technique combines foreground and background calibration to improve clock skew detection in time-interleaved analog-to-digital converters (ADCs), using a calibration circuit to determine and compensate for clock skew by integrating foreground and background calibration techniques, thereby enhancing the signal-to-noise ratio and reducing power overhead.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Productivity

If time-interleaved ADC structure is used to increase data rate, then productivity is improved, but timing mismatches among clock signals worsen the signal-to-noise ratio

Engineering Contradiction:
Improvedata rateVSAvoidsignal-to-noise ratio
Core Design Contradiction:
ProductivityVSMeasurement precision

Solution Approach 1:

The patent applies preliminary action by performing foreground calibration before the ADC operates in its normal mode. During this preliminary phase, a calibration signal is injected and processed to determine clock skew mismatches among the time-interleaved sub-ADCs. This advance calibration establishes correction values that are then applied during normal operation, allowing the system to achieve high data rates while maintaining signal-to-noise ratio through pre-established timing corrections.

Inventive Principle:
Principle #10Preliminary action

2Measurement precision

If clock skew detection is performed in high-speed applications, then measurement precision is improved, but detection accuracy worsens due to NOx and SO2 interference

Engineering Contradiction:
Improveclock skew detection accuracyVSAvoidnoise interference
Core Design Contradiction:
Measurement precisionVSObject-affected harmful factors

Solution Approach 1:

The patent extracts the clock skew detection function into a separate calibration mode that operates independently from the normal high-speed conversion mode. By injecting a known calibration signal and processing it through a dedicated calibration path, the system can accurately measure clock skew without the interference of noise factors present during normal operation. This separation allows precise measurement of timing mismatches that would otherwise be obscured by noise in high-speed applications.

Inventive Principle:
Principle #2Taking out (Extraction)

3Device complexity

If traditional calibration techniques are used, then device complexity is reduced, but calibration accuracy worsens due to dynamic variations in clock skew

Engineering Contradiction:
Improvecalibration system complexityVSAvoidcalibration accuracy
Core Design Contradiction:
Device complexityVSMeasurement precision

Solution Approach 1:

The patent implements dynamics by enabling the ADC to switch between two operational modes: calibration mode and normal conversion mode. The system dynamically adjusts its operation based on the need for calibration versus data processing. During calibration mode, the system performs accurate skew measurements and updates correction values. During normal mode, it applies these corrections while maintaining high-speed operation. This dynamic switching allows the system to achieve both calibration accuracy and high productivity without requiring overly complex continuous calibration mechanisms.

Inventive Principle:
Principle #15Dynamics

Data Source

PatentUS12556192B2Analog-to-digital converter, receiver, base station, mobile device and method for a time-interleaved analog-to-digital converter
Publication Date: 2026.02.17 INTEL CORP
  • US12556192B2 patent drawing
  • US12556192B2 patent drawing
  • US12556192B2 patent drawing

AI summary

An analog-to-digital converter, ADC, is provided. The ADC comprises multiple time-interleaved sub-ADCs, a detection circuit, and a calibration circuit. The sub-ADCs are configured to, when the ADC is in a calibration mode, generate a first signal by sampling a calibration signal based on a first clock signal and at least a second clock signal. The first clock signal comprises a phase shift relative to the second clock signal. The calibration circuit is configured to determine a first mismatch between the phase shift and a phase shift threshold based on the first signal. The detection circuit is configured to, when the ADC is in an operation mode, generate a second signal by sampling one of a biased signal to be received by the sub-ADCs or a second calibration signal based on at least one of the first clock signal and the second clock signal. The calibration circuit is configured to determine a second mismatch between the phase shift and the phase shift threshold based on the second signal and calibrate the ADC based on the first and the second mismatch.