Semiconductor ADC Correction Using Superposed Dispersion Current
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Solution Overview
Problem
Existing semiconductor devices with AD conversion circuits face increased testing costs and potential cost increases due to the need for high-precision AD conversion circuits or additional elements to introduce noise for error correction, which complicates the manufacturing process.
Innovation Solution
A semiconductor device design that includes a current generation circuit, correction circuit, averaging circuit, and superposition of a dispersion current during testing to improve resolution without increasing costs, using a dispersion current to enhance the averaging effect and reduce errors in AD conversion.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If a high-precision AD conversion circuit is installed to improve resolution, then measurement precision is improved, but device cost increases
Solution Approach 1:
The patent changes the sampling frequency parameter by performing oversampling at a frequency higher than the Nyquist frequency (twice the maximum analog signal frequency). This parameter change enables a low-resolution AD conversion circuit to achieve high-resolution measurements through digital filtering and averaging, thereby resolving the contradiction between measurement precision and device cost
Solution Approach 2:
The patent creates a digital copy of the analog signal through oversampling, then processes this digital copy through averaging filters to extract the true signal value. This copying approach allows high-precision measurement without requiring a high-precision AD converter, thus reducing device cost while maintaining measurement accuracy
2Measurement precision
If noise is introduced to improve averaging effect during testing, then measurement precision is improved, but device complexity increases
Solution Approach 1:
The patent makes the AD conversion circuit perform its own error correction by using its internal noise source to generate alternating current signals during testing. The circuit measures itself with the introduced noise, performs averaging to reduce errors, and stores correction data internally, eliminating the need for external noise-generating equipment and reducing overall system complexity
Solution Approach 2:
The patent uses periodic alternating current signals generated by an internal noise source during testing to enable the averaging circuit to reduce measurement errors. This periodic action is applied only during the testing phase, allowing error correction without adding continuous complexity to the operational circuit
3Measurement precision
If external equipment is used to generate alternating current signals during testing, then measurement precision is improved, but manufacturing cost increases
Solution Approach 1:
The patent enables the semiconductor device to generate its own alternating current test signals using an internal noise source and clock circuit, eliminating the need for external testing equipment. This self-service approach allows the device to perform its own characterization and error correction during manufacturing, thereby reducing testing costs while maintaining high measurement precision for correction data acquisition
Data Source
AI summary
A semiconductor device includes a first terminal, an oscillation circuit that generates a first clock signal and a second clock signal, an AD conversion circuit, a correction circuit that corrects the digital signal obtained by the AD conversion circuit based on a correction data stored in a memory circuit and outputs the digital signal, an averaging circuit, a sampling circuit, a current generation circuit, and a superposition circuit, the correction data is generated based on an output of the sampling circuit when a dispersion current is superposed on a detection current, and is stored in the memory circuit.