ADC Gain Error Calibration Using Piecewise Linear Modeling

Resolve Bottlenecks,
Find Innovative Solutions
Generate Solutions

Solution Overview

Problem

Existing methods for gain-error compensation in analog-to-digital converters (ADCs) fail to adequately address non-linearities and variances within the operating range, leading to significant accuracy degradation in precision analog-to-digital conversion systems.

Innovation Solution

Utilizing a digital-to-analog converter (DAC) with known low gain error and integral non-linearity characteristics to generate equally spaced analog voltage levels, which are sampled by the ADC, and employing piecewise linear basis functions to model and quantify gain error, allowing for precise compensation through least-squares analysis.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If traditional gain-error compensation methods are used in ADCs, then the device complexity is reduced, but the measurement precision deteriorates due to inadequate addressing of non-linearities and variances

Engineering Contradiction:
ImproveADC conversion accuracyVSAvoidcompensation system complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The patent divides the ADC operating range into multiple segments and applies piecewise linear basis functions to model gain error in each segment separately. This segmentation approach captures non-linearities and variances across different operating ranges, significantly improving measurement precision while keeping each local model relatively simple

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent implements a feedback mechanism where the ADC measures its own output and compares it with expected values. The error signal is fed back to the compensation logic, which adjusts the gain error compensation in real-time. This closed-loop feedback system continuously corrects measurement errors, maintaining high precision without requiring overly complex open-loop compensation circuits

Inventive Principle:
Principle #23Feedback

2Measurement precision

If piecewise linear basis functions with least-squares analysis are employed to model and quantify gain error, then the measurement precision is improved, but the calculation complexity increases

Engineering Contradiction:
Improvegain error quantification accuracyVSAvoiderror modeling complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The patent transforms the complex gain error compensation problem into a parameter estimation problem by using least-squares analysis. Instead of directly modeling the complex non-linear error behavior, the method changes parameters by fitting piecewise linear basis functions to measured error data, extracting coefficients that represent gain error characteristics. This parameter transformation simplifies the computational approach while maintaining high precision

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The patent introduces piecewise linear basis functions as intermediary mathematical tools between the raw error measurements and the final gain error compensation. These basis functions serve as mediators that decompose complex error patterns into manageable linear segments, making the least-squares analysis computationally tractable while preserving measurement precision

Inventive Principle:
Principle #24Intermediary (Mediator)

3Measurement precision

If a DAC with known low gain error is used to generate equally spaced analog voltage levels for ADC calibration, then the measurement precision is improved, but the device complexity increases

Engineering Contradiction:
Improvecalibration accuracyVSAvoidcalibration system complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The patent implements a self-service calibration approach where the system uses its own DAC to generate calibration voltage levels and its own ADC to measure them. The compensation logic then uses these self-generated measurements to determine and correct its own gain error. This self-calibration method improves measurement precision without requiring external calibration equipment, and the added complexity is minimal since it uses existing on-chip components

Inventive Principle:
Principle #25Self-service

Data Source

PatentUS20250385681A1Compensation of analog-to-digital converter (ADC) gain error
Publication Date: 2025.12.18 MICROCHIP TECHNOLOGY INC
  • US20250385681A1 patent drawing
  • US20250385681A1 patent drawing
  • US20250385681A1 patent drawing

AI summary

A method may include generating, via a sigma-delta DAC, a series of analog voltage levels that are equally spaced across a selected portion of ADC range; measuring, via the ADC, the series of analog voltages levels generated via the sigma-delta DAC; determining an error of a system at least partially based on a comparison of ADC output values and expected ADC output values, the system including the sigma-delta DAC and the ADC; modeling the error of the system using a combination of piecewise linear basis functions representing different types of errors or offsets; and determining a gain error of the ADC at least partially based on a coefficient of a linear basis function corresponding to the gain error of the ADC, the linear basis function one of the piecewise linear basis functions used to model the error of the system.