ADC Reference and Offset Calibration for Faster Precise Conversion
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Solution Overview
Problem
Analog-to-digital conversion circuits face a tradeoff between accuracy/resolution and speed/size/cost, as higher accuracy requires more time and space, and existing solutions do not efficiently optimize reference and offset voltages to balance these factors.
Innovation Solution
An analog-to-digital conversion circuit that dynamically adjusts reference and offset voltages based on characteristic values of the input analog voltage, using a logic controller to optimize bit generation with a lower quality ADC, thereby achieving higher accuracy and resolution while maintaining faster speed and smaller size.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If the number of bits generated by the ADC is increased to improve measurement accuracy and resolution, then the accuracy and resolution are improved, but the time required for bit generation increases and the physical space occupied increases
Solution Approach 1:
The patent dynamically changes the reference voltage parameter based on the input signal characteristics. By adjusting the reference voltage to match the actual signal range, the system achieves high measurement accuracy with fewer bits, thereby reducing conversion time while maintaining precision.
Solution Approach 2:
The system dynamically adapts the reference voltage during operation based on detected signal characteristics. This dynamic adjustment allows the ADC to optimize its performance for the current signal conditions, achieving high accuracy without requiring a fixed high-bit-depth converter that would take longer to convert.
2Measurement precision
If the number of bits generated by the ADC is increased to improve measurement accuracy and resolution, then the accuracy and resolution are improved, but the physical space occupied by the ADC increases
Solution Approach 1:
By changing the reference voltage parameter dynamically, the system achieves high measurement accuracy using a lower-bit ADC that occupies less physical space. The parameter adjustment compensates for the reduced bit depth, allowing accurate measurements without requiring a large, high-bit converter.
3Measurement precision
If a higher quality ADC is used to improve accuracy and resolution, then the accuracy and resolution are improved, but the cost and physical space increase
Solution Approach 1:
The patent uses parameter changes (reference voltage adjustment) to enable a lower-quality, less expensive ADC to achieve the same accuracy as a higher-quality ADC. This approach reduces manufacturing cost while maintaining measurement precision through intelligent parameter optimization rather than hardware upgrades.
4Measurement precision
If more sample points are taken in a given time interval to improve accuracy, then the accuracy is improved, but the processing time and complexity increase
Solution Approach 1:
By optimizing the reference voltage parameter, the system achieves high accuracy with fewer sample points and simpler processing. The parameter adjustment allows each sample to be more informative, reducing the total number of samples needed and thereby lowering processing complexity while maintaining or improving accuracy.
Data Source
AI summary
An analog-to-digital conversion circuit and a method for calibrating an analog-to-digital conversion circuit are provided. A digital translation of an analog voltage is analyzed to determine a characteristic value of the analog voltage. A reference voltage, with which the digital translation is generated, is set to a value that is a minimum amount greater than the characteristic value. Additional embodiments include setting an offset voltage, with which the digital translation is also generated.