Top-Plate Sampling ADC Residue Amplifier Linearity Adjustment

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Solution Overview

Problem

Non-linearity in the residue stage of top plate sampling ADC topologies reduces the accuracy of analog-to-digital converters (ADCs).

Innovation Solution

Incorporating a residue amplifier with a differential pair of transistors and a linearity adjustment circuit that adjusts its state as a function of the input sampling phase and gain phase, biasing the transistors in a depletion region or source follower mode to reduce ADC errors.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Speed

If a top plate sampling ADC topology is used, then the ADC can process high-speed signals, but non-linearity in the residue stage reduces conversion accuracy

Engineering Contradiction:
Improvesignal processing speedVSAvoidconversion accuracy
Core Design Contradiction:
SpeedVSMeasurement precision

Solution Approach 1:

The patent applies dynamics by making the tail current adjustable through a control voltage that varies with the common-mode input voltage. This dynamic adjustment of the tail current compensates for non-linearity in the residue amplifier stage, maintaining high conversion accuracy while preserving the high-speed signal processing capability of the top plate sampling topology

Inventive Principle:
Principle #15Dynamics

Solution Approach 2:

The patent changes the parameter of tail current magnitude based on the common-mode input voltage level. By dynamically adjusting this parameter, the system compensates for non-linear effects in the residue stage, thereby improving conversion accuracy without sacrificing the high-speed performance inherent in the top plate sampling architecture

Inventive Principle:
Principle #35Parameter changes

2Device complexity

If the residue amplifier operates in standard mode, then the circuit is simple, but linearity is poor causing ADC errors

Engineering Contradiction:
Improvecircuit simplicityVSAvoidlinearity
Core Design Contradiction:
Device complexityVSMeasurement precision

Solution Approach 1:

The patent changes the operating parameter of the residue amplifier by dynamically adjusting the tail current based on the common-mode input voltage. This parameter adjustment improves linearity and reduces ADC errors while maintaining relatively simple circuit architecture, thus resolving the contradiction between circuit simplicity and measurement precision

Inventive Principle:
Principle #35Parameter changes

Data Source

PatentUS20200212921A1Top plate sampling analog-to-digital converter (ADC) with residue amplifier non-linearity reduction
Publication Date: 2020.07.02 TEXAS INSTRUMENTS INC
  • US20200212921A1 patent drawing
  • US20200212921A1 patent drawing
  • US20200212921A1 patent drawing

AI summary

A top-plate sampling analog-to-digital converter (ADC) circuit includes a first ADC stage and a residue amplifier coupled to the first ADC stage. The residue amplifier comprises a first transistor with a control terminal, a first current terminal, and a second current terminal. The residue amplifier also comprises a second transistor with a control terminal, a first current terminal, and a second current terminal. The residue amplifier also comprises a linearity adjustment circuit coupled to a second current terminal of at least one of the first transistor and the second transistor. The linearity adjustment circuit comprises at least one switch that changes its state as a function of an input sampling phase and a gain phase of the residue amplifier.