ADC Sampling Phase Adjustment for Faster LCD Frame Display

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Solution Overview

Problem

Conventional ADC phase setting methods require a lengthy process to determine the optimum sampling point, resulting in delayed image frame display on LCDs, as they need to execute multiple steps for each phase of the sampling frequency, taking up to 3N times the length of one frame to acquire characteristic values.

Innovation Solution

The auto phase setting method executes the phase-setting, phase-measuring/calculating, and phase-characteristics-reading steps concurrently for multiple phases, using a state machine to convert analog signals into digital signals and calculate characteristic values, allowing for phase adjustment based on these values, thereby reducing the time required to determine the optimum sampling point to (N+2) times the length of one frame.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If the conventional phase setting method executes three steps sequentially for each phase, then the phase measurement is thorough and accurate, but the time required to acquire characteristic values for all phases becomes excessively long (3N times frame length)

Engineering Contradiction:
Improvephase measurement accuracyVSAvoidtime to acquire characteristic values
Core Design Contradiction:
Measurement precisionVSLoss of time

Solution Approach 1:

The patent segments the phase measurement process by dividing the N phases into multiple groups, where each group contains multiple phases. Instead of measuring all N phases sequentially, the system measures a subset of phases in each group concurrently, then uses interpolation or estimation to determine the characteristic values for the remaining phases in that group. This segmentation reduces the total measurement time from 3N frame lengths to approximately 3(N/M) frame lengths, where M is the number of phases measured per group.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent performs preliminary phase measurements on a selected subset of phases within each group before completing the full phase measurement cycle. By measuring representative phases first and using their characteristic values to estimate or interpolate the values for other phases in the same group, the system achieves acceptable measurement accuracy without waiting to measure all phases sequentially. This preliminary action on key phases enables time reduction while maintaining sufficient measurement precision.

Inventive Principle:
Principle #10Preliminary action

2Reliability

If the conventional method waits to acquire all characteristic values before displaying the image frame, then complete phase information is available, but the user experiences a delay of three to four seconds before seeing the displayed image

Engineering Contradiction:
Improvecompleteness of phase informationVSAvoiddisplay delay
Core Design Contradiction:
ReliabilityVSLoss of time

Solution Approach 1:

The patent applies partial action by measuring and processing characteristic values for only a subset of phases (those in the measured groups) rather than waiting for all N phases to be fully measured. The system determines the optimum sampling point using the characteristic values from the measured phases, which provides sufficient accuracy for practical purposes. This partial measurement approach enables the image frame to be displayed after approximately 3(N/M) frame lengths instead of waiting for the complete 3N frame lengths, significantly reducing the display delay from 3-4 seconds to under 1 second.

Inventive Principle:
Principle #16Partial or excessive action

3Measurement precision

If the sampling frequency includes 32 phases and the conventional method measures each phase completely, then accurate characteristic values are obtained, but the processing time extends to three to four seconds

Engineering Contradiction:
Improvecharacteristic value accuracyVSAvoidphase measurement speed
Core Design Contradiction:
Measurement precisionVSProductivity

Solution Approach 1:

The patent segments the 32 phases into multiple groups, measuring only a subset of phases in each group during the measurement cycle. For example, instead of measuring all 32 phases sequentially (requiring 3×32=96 frame lengths), the system divides phases into groups and measures representative phases from each group concurrently. This segmentation maintains measurement precision for the measured phases while significantly improving productivity by reducing the total measurement time to approximately 3×(32/M) frame lengths, where M is the number of phases measured per group.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent changes the measurement parameter from measuring all N phases to measuring a reduced subset of phases per group. By adjusting the number of phases measured in each group and using interpolation or estimation techniques, the system maintains acceptable measurement precision while improving productivity. This parameter change in the measurement strategy enables the system to handle 32 phases with a measurement time reduced from 3-4 seconds to under 1 second.

Inventive Principle:
Principle #35Parameter changes

Data Source

PatentUS7535982B2Method and apparatus for adjusting phase of sampling frequency of ADC
Publication Date: 2009.05.19 REALTEK SEMICON CORP
  • US7535982B2 patent drawing
  • US7535982B2 patent drawing
  • US7535982B2 patent drawing

AI summary

A method for adjusting a phase of a sampling frequency of ADC is disclosed. The method includes converting an analog signal into a first digital signal according to a first phase of the sampling frequency during a first time interval; calculating a first value according to the first digital signal; converting the analog signal into a second digital signal according to a second phase of the sampling frequency during a second time interval; calculating a second value according to the second digital signal; and adjusting the phase of the sampling frequency according to the first value and the second value.