ADC Self-Test Using RC Decay Signals for Error Detection
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Solution Overview
Problem
Electrosurgical systems face challenges in accurately detecting and mitigating errors associated with analog-to-digital converters (ADCs), which can lead to loss of conversion linearity, scale, and monotonicity due to faulty reference voltage signals or stuck or shorted bits, particularly in medical devices where precise control is critical.
Innovation Solution
A system and method that includes a test pulse source, a test circuit with a resistor and capacitor, and a controller to generate and analyze a decaying voltage signal, comparing it to a predetermined response to detect deviations and output error signals, ensuring reliable detection and minimization of ADC faults.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If ADCs are used for signal conversion in electrosurgical systems, then signal processing capability is improved, but errors such as loss of conversion linearity, scale, and monotonicity may occur due to faulty reference voltage signals or stuck/shorted bits
Solution Approach 1:
The system performs preliminary self-testing of the ADC by applying a test voltage and comparing the digital output against expected values before actual electrosurgical operation. This preliminary action detects potential errors in conversion linearity, scale, and monotonicity, preventing faulty ADC operation during critical surgical procedures.
Solution Approach 2:
The system implements feedback by continuously monitoring the ADC's digital output against predetermined thresholds and expected ranges. When deviations are detected (such as non-monotonic transitions or scale errors), the system generates error signals and can shut down operation, creating a closed-loop reliability mechanism that maintains measurement precision while preventing error propagation.
2Reliability
If self-testing mechanisms are implemented to detect ADC errors, then system reliability is improved, but device complexity increases due to additional test circuits and control logic
Solution Approach 1:
The test voltage source is integrated with the existing DAC (digital-to-analog converter) in the system. The DAC normally generates waveforms for electrosurgical operation, but can also generate test voltages for ADC self-testing. This merging eliminates the need for a completely separate test voltage source, reducing device complexity while maintaining reliability improvement.
Solution Approach 2:
The ADC system performs self-testing using its own integrated DAC and control logic. The system tests itself without requiring external test equipment or separate dedicated test hardware, thereby improving reliability through continuous monitoring while minimizing the addition of external complexity. The self-service approach allows the ADC to detect its own errors using resources already present in the system.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This solution provides a simple and reliable means to determine the operational state of ADCs, preventing faults and ensuring accurate signal conversion, thereby enhancing the reliability of electrosurgical systems by quickly identifying and mitigating errors.
Implementation Method 1
a test circuit coupled to the test pulse source and configured to provide an analog decaying voltage signal in response to the test pulse signal
Implementation Method 2
an analog-to-digital converter coupled to the test circuit and configured to convert the analog decaying voltage signal into a digital decaying voltage signal
Data Source
AI summary
The present disclosure provides for a system for testing an analog-to-digital converter. The system includes a test pulse source configured to provide a test pulse signal; a test circuit coupled to the test pulse source and configured to provide an analog decaying voltage signal in response to the test pulse signal; and an analog-to-digital converter coupled to the test circuit and configured to convert the analog decaying voltage signal into a digital decaying voltage signal.